Inventor
Scott William Jessen
Inventor
Allen, TX, US
Overview
Patents· 29 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1022%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1021%
H10DInorganic electric semiconductor devices18%
H01LSemiconductor devices16%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices9%
H10BElectronic memory devices5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G06FElectric digital data processing1%
H01JElectric discharge tubes or discharge lamps1%
Y10TTechnical subjects covered by former us classification1%
PatentTitleYear
10,756,095SRAM cell with T-shaped contact202010,748,913SRAM cell with T-shaped contact202010,566,200Method of fabricating transistors, including ambient oxidizing after etchings into barrier layers and anti-reflecting coatings202010,199,380SRAM cell with T-shaped contact201910,163,911SRAM cell with T-shaped contact201810,103,171Metal on elongated contacts201810,043,714Elongated contacts using litho-freeze-litho-etch process20189,620,419'Elongated contacts using litho-freeze-litho-etch process'20179,343,332'Alignment to multiple layers'20169,312,170'Metal on elongated contacts'20169,305,848'Elongated contacts using litho-freeze-litho-etch process'20169,117,775'Alignment to multiple layers'20159,054,214'Methodology of forming CMOS gates on the secondary axis using double-patterning technique'20159,024,450'Two-track cross-connect in double-patterned structure using rectangular via'20158,580,675'Two-track cross-connect in double-patterned structure using rectangular via'20137,987,436'Sub-resolution assist feature to improve symmetry for contact hole lithography'20117,745,067'Method for performing place-and-route of contacts and vias in technologies with forbidden pitch requirements'20107,512,928'Sub-resolution assist feature to improve symmetry for contact hole lithography'20097,461,367'Modifying merged sub-resolution assist features of a photolithographic mask'20087,425,502'Minimizing resist poisoning in the manufacture of semiconductor devices'20087,262,129'Minimizing resist poisoning in the manufacture of semiconductor devices'20077,067,419'Mask layer and dual damascene interconnect structure in a semiconductor device'20066,893,800'Substrate topography compensation at mask design: 3D OPC topography anchored'20056,879,046'Split barrier layer including nitrogen-containing portion and oxygen-containing portion'20056,798,043'Structure and method for isolating porous low-k dielectric films'20046,708,574'Abnormal photoresist line/space profile detection through signal processing of metrology waveform'20046,627,885'Method of focused ion beam pattern transfer using a smart dynamic template'20036,258,610'Method analyzing a semiconductor surface using line width metrology with auto-correlation operation'20016,225,639'Method of monitoring a patterned transfer process using line width metrology'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001Patents assigned to AGERE SYST GUARDIAN CORP (2)· patent assignee history
2001–2006Based in Orlando, FL, US· patent location history
2003–2006Patents assigned to AGERE SYSTEMS INC (6)· patent assignee history
2007–2020Patents assigned to TEXAS INSTRUMENTS INC (21)· patent assignee history
2007–2020Based in Allen, TX, US· patent location history
2018–2019Patents assigned to ATON THOMAS J (2)· patent assignee history
2018–2019Patents assigned to HOUSTON THEODORE W (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 21 | 2007–2020 |
| AGERE SYSTEMS INC | 6 | 2003–2006 |
| AGERE SYST GUARDIAN CORP | 2 | 2001 |
| ATON THOMAS J | 2 | 2018–2019 |
| HOUSTON THEODORE W | 2 | 2018–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Allen, Texas, US | 21 | 2007–2020 |
| Orlando, Florida, US | 8 | 2001–2006 |