Inventor
David G. Brochu, Jr.
Inventor
East Hardwick, VT, US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables33%
H01LSemiconductor devices22%
H03KPulse technique11%
H10DInorganic electric semiconductor devices11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1011%
PatentTitleYear
10,103,060Test structures for dielectric reliability evaluations20189,059,281'Dual L-shaped drift regions in an LDMOS device and method of making the same'20158,754,655'Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration'20148,587,383'Measuring bias temperature instability induced ring oscillator frequency degradation'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2015Patents assigned to IBM (3)· patent assignee history
2013–2014Patents assigned to BROCHU JR DAVID G (2)· patent assignee history
2013–2014Patents assigned to MERRILL TRAVIS S (2)· patent assignee history
2013–2018Based in East Hardwick, VT, US· patent location history
2014Patents assigned to CHEN FEN (1)· patent assignee history
2014Patents assigned to DUFRESNE ROGER A (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 3 | 2013–2015 |
| BROCHU JR DAVID Gself | 2 | 2013–2014 |
| MERRILL TRAVIS S | 2 | 2013–2014 |
| CHEN FEN | 1 | 2014 |
| DUFRESNE ROGER A | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| East Hardwick, VT, US | 4 | 2013–2018 |