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Inventor

Shuen-Cheng Lei

Inventor
Taipei, TW

Overview

3→
Patents
2010–2013
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables40%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1020%
PatentTitleYear
8,516,400'Method for predicting tolerable spacing between conductors in semiconductor process'20138,487,644'Method and pattern carrier for optimizing inspection recipe of defect inspection tool'20137,817,265'Alignment mark and defect inspection method'2010

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2010–2013Patents assigned to UNITED MICROELECTRONICS CORP (3)· patent assignee history
2010Based in Tainan, TW· patent location history
2013Patents assigned to LEI SHUEN-CHENG (2)· patent assignee history
2013Patents assigned to HOU CHUN-LIANG (1)· patent assignee history
2013Patents assigned to HSIEH MIN-CHIN (1)· patent assignee history
2013Patents assigned to HUANG HUAI-TE (1)· patent assignee history
2013Based in Taipei, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
UNITED MICROELECTRONICS CORP32010–2013
LEI SHUEN-CHENGself22013
HOU CHUN-LIANG12013
HSIEH MIN-CHIN12013
HUANG HUAI-TE12013
Locations
LocationPatentsSpan
Taipei, TW22013
Tainan, TW12010