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Inventor

Anthony Vacca

Inventor
Cedar Park, TX, US

Overview

6→
Patents
1977–2004
Patent span
Physics
Primary field (CPC G)

Patents· 6 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%
G06VImage or video recognition or understanding17%
H01RElectrically-conductive connections17%
H05KPrinted circuits17%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
PatentTitleYear
6,731,787'System and method for determining reticle defect printability'20046,381,358'System and method for determining reticle defect printability'20026,076,465'System and method for determining reticle defect printability'20005,211,565'High density interconnect apparatus'19935,167,511'High density interconnect apparatus'19924,037,270'Circuit packaging and cooling'1977

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1977Patents assigned to CONTROL DATA CORP (1)· patent assignee history
1977Based in New Brighton, MN, US· patent location history
1992–1993Patents assigned to CRAY RESEARCH INC (2)· patent assignee history
1992–1993Based in Eau Claire, WI, US· patent location history
2000–2004Patents assigned to KLA TENCOR CORP (3)· patent assignee history
2000–2004Based in Cedar Park, TX, US· patent location history
2002Based in Ceder Park, TX, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KLA TENCOR CORP32000–2004
CRAY RESEARCH INC21992–1993
CONTROL DATA CORP11977
Locations
LocationPatentsSpan
Cedar Park, Texas, US22000–2004
Eau Claire, WI, US21992–1993
Ceder Park, Texas, US12002
New Brighton, Minnesota, US11977