Inventor
Walter Jenisch
Inventor
Heidenheim, DE
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions47%
G01DMeasuring not specially adapted for a specific variable18%
LOC1018%
B82YSpecific uses or applications of nanostructures6%
F16FSprings6%
G01QScanning-probe techniques or apparatus6%
PatentTitleYear
11,060,891Holder for multiple reference standards for calibrating a measurement system202110,809,104Holder for a plurality of reference standards for calibrating a measurement system202010,794,678Apparatus for measuring the roughness of a workpiece surface20209,261,344'Probe head for a coordinate measuring machine for determining spatial coordinates on a measurement object'20169,140,532'Measuring head for a coordinate measuring machine for determining spatial coordinates on a measurement object'2015D0712758'Storage device for a probe head'2014D0686927'Stylus plate for a probe head'2013D0685275'Probe head for coordinate measuring machine'20137,284,337'Probe head for a coordinate measuring machine'20077,142,999'Method and device for correcting guiding errors in a coordinate measuring machine'20066,922,905'Probe head for a coordinate measuring apparatus'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2021Based in Heidenheim, DE· patent location history
2006–2016Patents assigned to ZEISS IND MESSTECHNIK GMBH (6)· patent assignee history
2013Patents assigned to BRENNER KURT (2)· patent assignee history
2013Patents assigned to ENGEL THOMAS (2)· patent assignee history
2013Patents assigned to JENISCH WALTER (2)· patent assignee history
2014–2021Patents assigned to ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS IND MESSTECHNIK GMBH | 6 | 2006–2016 |
| ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH | 4 | 2014–2021 |
| BRENNER KURT | 2 | 2013 |
| ENGEL THOMAS | 2 | 2013 |
| JENISCH WALTERself | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Heidenheim, DE | 11 | 2005–2021 |