Inventor
Gary L. Woods
Inventor
Sunnyvale, CA, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables38%
H04NPictorial communication, e.g. television17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
H03MCoding8%
G02BOptical elements, systems or apparatus4%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light4%
H05BElectric heating4%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h104%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications4%
PatentTitleYear
9,521,306'Apparatus and method for compressive imaging and sensing through multiplexed modulation via spinning disks'20169,124,755'Apparatus and method for compressive imaging and sensing through multiplexed modulation'20158,717,463'Adaptively filtering compressive imaging measurements to attenuate noise'20148,634,009'Dynamic range optimization in a compressive imaging system'20148,451,009'Techniques employing light-emitting circuits'20137,679,358'System and method for voltage noise and jitter measurement using time-resolved emission'20107,616,312'Apparatus and method for probing integrated circuits using laser illumination'20097,450,245'Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system'20087,243,039'System and method for determining probing locations on IC'20077,232,526'Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing'20077,012,537'Apparatus and method for determining voltage using optical observation'20066,780,658'Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing'20046,737,880'Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions'20046,596,980'Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting'20036,579,732'Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing'20036,519,744'Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane'20036,501,597'Optical amplifier using wavelength converter'20026,355,494'Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2007Patents assigned to INTEL CORP (7)· patent assignee history
2002–2010Based in Sunnyvale, CA, US· patent location history
2008–2010Patents assigned to DCG SYSTEMS INC (3)· patent assignee history
2013–2016Patents assigned to WOODS GARY (3)· patent assignee history
2013Based in San Diego, CA, US· patent location history
2014–2016Patents assigned to KELLY KEVIN F (3)· patent assignee history
2014–2016Based in Houston, TX, US· patent location history
2015–2016Patents assigned to BARANIUK RICHARD G (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INTEL CORP | 7 | 2002–2007 |
| DCG SYSTEMS INC | 3 | 2008–2010 |
| KELLY KEVIN F | 3 | 2014–2016 |
| WOODS GARYself | 3 | 2013–2016 |
| BARANIUK RICHARD G | 2 | 2015–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sunnyvale, California, US | 13 | 2002–2010 |
| Houston, Texas, US | 4 | 2014–2016 |
| San Diego, California, US | 1 | 2013 |