Inventor
Paavana Sainath
Inventor
Oconomowoc, WI, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis49%
G06TImage data processing or generation, in general22%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests8%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G01TMeasurement of nuclear or x-radiation5%
G01VGeophysics3%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data3%
H01JElectric discharge tubes or discharge lamps3%
Y10TTechnical subjects covered by former us classification3%
PatentTitleYear
9,836,862Methods and systems for contrast enhanced imaging with single energy acquisition20179,483,851'Systems and methods for filtering for image generation'20169,074,986'System and method for reducing high density artifacts in computed tomography imaging'20159,025,815'System and method for multi-material correction of image data'20158,971,605'System and method for correcting for metal artifacts using multi-energy computed tomography'20158,942,341'Method of dose reduction for CT imaging and apparatus for implementing same'20158,811,709'System and method for multi-material correction of image data'20148,483,361'Anode target for an x-ray tube and method for controlling the x-ray tube'20138,483,471'Method and system for scatter correction in X-ray imaging'20138,406,537'Computed tomography system with data compression and transfer'20138,270,562'Multiple X-ray tube system and method of making same'20128,155,265'Asymmetric de-populated detector for computed tomography and method of making same'20127,813,474'Method and apparatus for performing dual-spectrum CT with fast KV modulation at multiple-view intervals'20107,801,264'Method for calibrating a dual -spectral computed tomography (CT) system'20107,747,057'Methods and apparatus for BIS correction'20107,602,951'Method and system for providing defective cell correction in a medical imaging device'20097,379,527'Methods and apparatus for CT calibration'20087,283,605'Methods and apparatus for scatter correction'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2017Patents assigned to GEN ELECTRIC (18)· patent assignee history
2007–2016Based in Oconomowoc, WI, US· patent location history
2012–2015Patents assigned to SAINATH PAAVANA (7)· patent assignee history
2012–2015Patents assigned to HSIEH JIANG (4)· patent assignee history
2012–2015Patents assigned to WU XIAOYE (4)· patent assignee history
2012–2015Patents assigned to IKHLEF ABDELAZIZ (3)· patent assignee history
2017Based in North Haledon, NJ, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 18 | 2007–2017 |
| SAINATH PAAVANAself | 7 | 2012–2015 |
| HSIEH JIANG | 4 | 2012–2015 |
| WU XIAOYE | 4 | 2012–2015 |
| IKHLEF ABDELAZIZ | 3 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Oconomowoc, WI, US | 17 | 2007–2016 |
| North Haledon, New Jersey, US | 1 | 2017 |