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Inventor

Jiayao Zhang

Inventor
Sunnyvale, CA, US

Overview

2→
Patents
2014–2015
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions33%
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
PatentTitleYear
9,052,190'Bright-field differential interference contrast system with scanning beams of round and elliptical cross-sections'20158,755,044'Large particle detection for multi-spot surface scanning inspection systems'2014

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2014–2015Patents assigned to KLA TENCOR CORP (2)· patent assignee history
2014Patents assigned to AMSDEN CHARLES (1)· patent assignee history
2014Patents assigned to REICH JUERGEN (1)· patent assignee history
2014Patents assigned to WOLTERS CHRISTIAN (1)· patent assignee history
2014Patents assigned to ZHANG JIAYAO (1)· patent assignee history
2014–2015Based in Sunnyvale, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KLA TENCOR CORP22014–2015
AMSDEN CHARLES12014
REICH JUERGEN12014
WOLTERS CHRISTIAN12014
ZHANG JIAYAOself12014
Locations
LocationPatentsSpan
Sunnyvale, California, US22014–2015