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Inventor

Takeyoshi Ohashi

Inventor
Tokyo, JP

Overview

15→
Patents
2014–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 15 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps47%
G01BMeasuring length, thickness or similar linear dimensions9%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G06KGraphical data reading6%
G06TImage data processing or generation, in general6%
H01LSemiconductor devices6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
B82YSpecific uses or applications of nanostructures3%
G01RMeasuring electric variables3%
G06VImage or video recognition or understanding3%
PatentTitleYear
10,727,024Charged particle beam device and aberration correction method for charged particle beam device202010,446,361Aberration correction method, aberration correction system, and charged particle beam apparatus201910,134,558Scanning electron microscope20189,830,524Method for estimating shape before shrink and CD-SEM apparatus20179,543,053'Electron beam equipment'20179,536,170'Measurement method, image processing device, and charged particle beam apparatus'20179,443,695'Charged-particle beam device'20169,305,744'Measuring method, data processing apparatus and electron microscope using same'20169,287,084'Aberration corrector and charged particle beam apparatus using the same'20169,230,775'Charged particle instrument'20169,129,775'Specimen potential measuring method, and charged particle beam device'20158,816,277'Pattern evaluation method, device therefor, and electron beam device'20148,735,814'Electron beam device'20148,704,175'Scanning electron microscope'20148,637,820'Scanning electron microscope and inspection method using same'2014

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2014–2020Patents assigned to HITACHI HIGH TECH CORP (15)· patent assignee history
2014–2017Patents assigned to OHASHI TAKEYOSHI (7)· patent assignee history
2014–2016Patents assigned to FUKUDA MUNEYUKI (5)· patent assignee history
2014–2016Patents assigned to SOHDA YASUNARI (5)· patent assignee history
2014–2016Patents assigned to TAKAHASHI NORITSUGU (2)· patent assignee history
2014–2020Based in Tokyo, JP· patent location history
2015Based in Tachikawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP152014–2020
OHASHI TAKEYOSHIself72014–2017
FUKUDA MUNEYUKI52014–2016
SOHDA YASUNARI52014–2016
TAKAHASHI NORITSUGU22014–2016
Locations
LocationPatentsSpan
Tokyo, JP142014–2020
Tachikawa, JP12015