Inventor
Hiroaki Ebihara
Inventor
Kanagawa, JP
Overview
Patents· 55 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television41%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation14%
H01LSemiconductor devices13%
H03KPulse technique9%
H03MCoding8%
H10DInorganic electric semiconductor devices2%
G01DMeasuring not specially adapted for a specific variable2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them2%
G06VImage or video recognition or understanding2%
PatentTitleYear
11,095,836Image sensor far end driver circuitry providing fast settling row control signals202110,951,840Versatile image sensor circuit202110,924,701Column amplifier reset circuit with comparator202110,827,143CMOS image sensor clamping method with divided bit lines202010,826,470Integrating ramp circuit with reduced ramp settling time202010,819,936Bias circuit for use with divided bit lines202010,750,111CMOS image sensor with divided bit lines202010,659,055Two stage gray code counter with a redundant bit202010,659,056Gray code counting signal distribution system202010,615,190Dual conversion gain high dynamic range readout for comparator of double ramp analog to digital converter202010,510,796Small pixels having dual conversion gain providing high dynamic range201910,498,999Comparator for double ramp analog to digital converter201910,498,993Ramp signal settling reduction circuitry201910,498,322Comparator output circuitry for single slope analog to digital converter201910,431,608Dual conversion gain high dynamic range readout for comparator of double ramp analog to digital converter201910,375,338Two stage amplifier readout circuit in pixel level hybrid bond image sensors201910,356,351Image sensor with dual conversion gain readout201910,326,958Comparator for double ramp analog to digital converter201910,290,673Bitline settling improvement and FPN reduction by floating bitline during charge transfer201910,263,031Feedback capacitor and method for readout of hybrid bonded image sensors201910,218,924Low noise CMOS image sensor by stack architecture201910,171,765Bit line boost for fast settling with current source of adjustable size201910,165,210Bitline settling improvement by using dummy pixels for clamp201810,116,892Bitline boost for fast settling with current source of adjustable bias201810,079,990Comparator for double ramp analog to digital converter201810,051,212Solid state imaging apparatus, signal reading method, and electronic apparatus20189,967,505Comparators for double ramp analog to digital converter20189,924,122'Solid-state imaging device, method of driving the solid-state imaging device, and electronic device'20189,859,312'Feedback capacitor formed by bonding-via in pixel level bond'20189,838,621Method and system for implementing H-banding cancellation in an image sensor20179,774,811'Ramp signal generator for double ramp analog to digital converter'20179,762,825'Method and system for reducing analog-to-digital conversion time for dark signals'20179,712,765'Solid-state image pickup device and camera system'20179,712,766'Signal processing device and method, imaging device and solid state imaging element'20179,671,282'Imaging device and imaging method having an illuminance calculation unit calculating respective illuminances corresponding to digital signals'20179,661,242'Solid state imaging apparatus, signal reading method, and electronic apparatus'20179,648,267'Image sensor and control method for image sensor'20179,525,835'Solid-state image pickup device and camera system'20169,288,411'Image sensor and control method for image sensor'20169,237,287'Solid-state imaging device, method of driving the solid-state imaging device, and electronic device'20169,157,794'Imaging device and imaging method having saturation determination for an illuminance calculation'20159,160,940'Signal processing device and method, imaging device and solid state imaging element'20159,083,352'Oscillator, oscillating method, image sensor, and imaging apparatus'20159,025,056'Solid state imaging element and camera system that determine in which horizontal read period a dummy pixel section is to be shuttered'20158,830,352'Image pickup device'20148,810,704'Solid state image capture device and camera system'20148,773,580'Solid-state image pickup device and camera system'20148,629,923'Solid-state imaging element and camera system that determine in which horizontal read period a dummy pixel section is to be shuttered'20148,610,809'Solid-state imaging device and camera system that controls a unit of plural rows'20138,520,105'Solid-state image pickup device and camera system'20138,223,237'Solid-state imaging device in which a transfer signal line is held at a constant voltage to prevent crosstalk and electronic device with such solid-state imaging device'20128,174,598'Solid state image capture device and camera system'20127,327,596'Electrostatic capacitance detection device and smart card'20087,196,528'Electrostatic capacitance detection device'20077,116,116'Capacitance detecting device'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2008Patents assigned to SEIKO EPSON CORP (3)· patent assignee history
2006–2008Based in Fujimi, JP· patent location history
2007Based in Suwa-shi, JP· patent location history
2012–2018Patents assigned to SONY CORP (20)· patent assignee history
2012–2016Patents assigned to EBIHARA HIROAKI (9)· patent assignee history
2012–2016Patents assigned to KUDOH YOSHIHARU (3)· patent assignee history
2012–2018Based in Kanagawa, JP· patent location history
2017–2021Patents assigned to OMNIVISION TECH INC (30)· patent assignee history
2017–2021Based in Santa Clara, CA, US· patent location history
2018–2021Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMNIVISION TECH INC | 30 | 2017–2021 |
| SONY CORP | 20 | 2012–2018 |
| EBIHARA HIROAKIself | 9 | 2012–2016 |
| KUDOH YOSHIHARU | 3 | 2012–2016 |
| SEIKO EPSON CORP | 3 | 2006–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 22 | 2012–2018 |
| Santa Clara, California, US | 18 | 2017–2021 |
| San Jose, California, US | 12 | 2018–2021 |
| Fujimi, JP | 2 | 2006–2008 |
| Suwa-shi, JP | 1 | 2007 |