Inventor
Yaron De Leeuw
Inventor
IL
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions17%
G01CMeasuring distances, levels or bearings17%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%
G06FElectric digital data processing17%
H01LSemiconductor devices17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
PatentTitleYear
11,862,522Accuracy improvements in optical metrology2024Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2024Patents assigned to KLA TENCOR CORP (1)· patent assignee history
2024Based in IL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| IL | 1 | 2024 |