Inventor
Wei-Qi Sun
Inventor
Shenzhen, CN
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions22%
H05BElectric heating22%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H01JElectric discharge tubes or discharge lamps11%
H03MCoding11%
H04NPictorial communication, e.g. television11%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests11%
PatentTitleYear
10,692,693System and method for measuring patterns20208,509,602'Recording control apparatus and method, and program'20137,990,080'System and method for controlling multiple light sources'20117,904,272'System and method for calculating coordinate values of a measuring machine'20117,760,211'System and method for light control'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2011Patents assigned to HON HAI PREC IND CO LTD (3)· patent assignee history
2010–2011Patents assigned to HONGFUJIN PREC IND SHENZHEN (3)· patent assignee history
2010–2011Based in Shenzhen, CN· patent location history
2013Patents assigned to ASAZU HIDEKI (1)· patent assignee history
2013Patents assigned to KATSUMOTO TOSHIYUKI (1)· patent assignee history
2013–2020Based in Tokyo, JP· patent location history
2020Patents assigned to HITACHI HIGH TECH CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HON HAI PREC IND CO LTD | 3 | 2010–2011 |
| HONGFUJIN PREC IND SHENZHEN | 3 | 2010–2011 |
| ASAZU HIDEKI | 1 | 2013 |
| HITACHI HIGH TECH CORP | 1 | 2020 |
| KATSUMOTO TOSHIYUKI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Shenzhen, CN | 3 | 2010–2011 |
| Tokyo, JP | 2 | 2013–2020 |