Inventor

Mishio Hayashi

Inventor

Saitama, JP

Overview

23→

Patents

1981–2021

Patent span

Physics

Primary field (CPC G)

Patents· 23 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables33%

G04FTime-interval measuring25%

G06FElectric digital data processing8%

H04LTransmission of digital information, e.g. telegraphic communication8%

H03KPulse technique6%

H04JMultiplex communication6%

G01BMeasuring length, thickness or similar linear dimensions3%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein3%

G06GAnalogue computers3%

G09GArrangements or circuits for control of indicating devices using static means to present variable information3%

PatentTitleYear

10,915,202Display device with a touch sensor2021 7,495,452'Wire harness checker and wire harness checking method'2009 7,332,914'Conductor inspection apparatus and conductor inspection method'2008 6,574,168'Time measuring device and testing apparatus'2003 5,764,045'Frequency measuring apparatus'1998 5,757,221'Analog arithmetic circuit'1998 5,381,100'Pulse signal measuring instrument'1995 5,325,049'Frequency deviation measuring apparatus'1994 5,319,614'Time interval measuring apparatus'1994 5,293,520'Jitter analyzer'1994 5,239,546'Data multiplexing device'1993 5,163,069'Pattern synchronizing circuit and method'1992 5,150,390'High-rate pulse pattern generator'1992 4,901,264'Pseudo random pattern generating device'1990 4,878,233'Data pattern synchronizer'1989 4,870,664'Continuous counting device'1989 RE032845'Period and frequency measuring instrument'1989 4,769,798'Successive period-to-voltage converting apparatus'1988 4,611,926'Time interval measuring instrument'1986 4,600,994'Phase difference measuring apparatus'1986 4,544,884'Period and frequency measuring instrument'1985 4,523,288'Interval-expanding timer'1985 4,267,436'Interval-expanding timer compensated for drift and nonlinearity'1981

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1981Patents assigned to HAYASHI MISHIO (1)· patent assignee history

1985–1986Patents assigned to TAKEDA RIKEN IND CO LTD (4)· patent assignee history

1985–2009Based in Saitama, JP· patent location history

1988–2003Patents assigned to ADVANTEST CORP (14)· patent assignee history

1989–1994Based in Ohsato, JP· patent location history

1994–2021Based in Tokyo, JP· patent location history

1998Based in Nerima-ku, JP· patent location history

1998Based in Suwa, JP· patent location history

2008–2009Patents assigned to OHT INC (2)· patent assignee history

2021Patents assigned to JAPAN DISPLAY INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ADVANTEST CORP	14	1988–2003
TAKEDA RIKEN IND CO LTD	4	1985–1986
OHT INC	2	2008–2009
HAYASHI MISHIOself	1	1981
JAPAN DISPLAY INC	1	2021

Locations

Location	Patents	Span
Saitama, JP	13	1985–2009
Tokyo, JP	4	1994–2021
Ohsato, JP	2	1989–1994
Nerima-ku, JP	1	1998
Suwa, JP	1	1998