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Inventor

James F. Tomic

Inventor
Oakland, CA, US

Overview

10→
Patents
1995–2020
Patent span
Physics
Primary field (CPC G)

Patents· 10 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables34%
G06FElectric digital data processing31%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1031%
H01RElectrically-conductive connections3%
PatentTitleYear
10,852,347Apparatus for testing electronic devices202010,094,872Apparatus for testing electronic devices20189,316,683'Apparatus for testing electronic devices'20169,151,797'Apparatus for testing electronic devices'20158,747,123'Apparatus for testing electronic devices'20148,628,336'Apparatus for testing electronic devices'20148,506,335'Apparatus for testing electronic devices'20138,388,357'Apparatus for testing electronic devices'20138,118,618'Apparatus for testing electronic devices'20125,429,510'High-density interconnect technique'1995

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1995Based in San Francisco, CA, US· patent location history
2012–2020Patents assigned to AEHR TEST SYSTEMS (8)· patent assignee history
2012–2014Patents assigned to BURKE PAUL W (4)· patent assignee history
2012–2014Patents assigned to CAO DOAN D (4)· patent assignee history
2012–2014Patents assigned to CARBONE MARK C (4)· patent assignee history
2012–2014Patents assigned to DEBOE KENNETH W (4)· patent assignee history
2012–2020Based in Oakland, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
AEHR TEST SYSTEMS82012–2020
BURKE PAUL W42012–2014
CAO DOAN D42012–2014
CARBONE MARK C42012–2014
DEBOE KENNETH W42012–2014
Locations
LocationPatentsSpan
Oakland, California, US92012–2020
San Francisco, California, US11995