Inventor
Naohito Kohashi
Inventor
Kawasaki, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1026%
G01RMeasuring electric variables22%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1015%
Y10TTechnical subjects covered by former us classification15%
H01RElectrically-conductive connections7%
H05KPrinted circuits7%
A01KAnimal husbandry4%
B60MPower supply lines, and devices along rails, for electrically- propelled vehicles4%
PatentTitleYear
8,268,670'Method of semiconductor device protection'20128,164,181'Semiconductor device packaging structure'20127,977,961'Component for testing device for electronic component and testing method of the electronic component'20117,921,906'Temperature control method and temperature control device'20117,825,676'Contactor and test method using contactor'20107,807,481'Method of semiconductor device protection, package of semiconductor device'20107,471,096'Contactor for electronic parts and a contact method'20087,382,046'Semiconductor device protection cover, and semiconductor device unit including the cover'20086,784,657'Handling apparatus and test set using the handling apparatus'20046,767,219'Contactor, method for manufacturing such contactor, and testing method using such contactor'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2008Patents assigned to FUJITSU LTD (4)· patent assignee history
2004–2012Based in Kawasaki, JP· patent location history
2010–2012Patents assigned to FUJITSU SEMICONDUCTOR LTD (6)· patent assignee history
2010Based in Kanagawa, JP· patent location history
2012Patents assigned to FUKUDA KEISUKE (2)· patent assignee history
2012Patents assigned to KOHASHI NAOHITO (2)· patent assignee history
2012Patents assigned to MARUYAMA SHIGEYUKI (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJITSU SEMICONDUCTOR LTD | 6 | 2010–2012 |
| FUJITSU LTD | 4 | 2004–2008 |
| FUKUDA KEISUKE | 2 | 2012 |
| KOHASHI NAOHITOself | 2 | 2012 |
| MARUYAMA SHIGEYUKI | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 9 | 2004–2012 |
| Kanagawa, JP | 1 | 2010 |