Inventor
Kevin W. Gorman
Inventor
Fairfax, VT, US
Overview
Patents· 36 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores59%
G01RMeasuring electric variables18%
G06FElectric digital data processing10%
H03KPulse technique6%
G11BInformation storage based on relative movement between record carrier and transducer4%
G01KMeasuring temperature2%
H03MCoding2%
PatentTitleYear
11,017,873Memory bypass function for a memory202110,650,906Memory bypass function for a memory202010,622,090Arbitration for memory diagnostics202010,153,055Arbitration for memory diagnostics20189,946,620Memory built-in self test system20189,865,361'Diagnostics for a memory device'20189,799,413'Multi-domain fuse management'20179,773,570'Built-in-self-test (BIST) test time reduction'20179,734,920'Memory test with in-line error correction code logic to test memory data and test the error correction code logic surrounding the memories'20179,514,844'Fast auto shift of failing memory diagnostics data using pattern detection'20169,460,811'Read only memory (ROM) with redundancy'20169,224,503'Memory test with in-line error correction code logic'20159,172,373'Verifying partial good voltage island structures'20158,935,586'Staggered start of BIST controllers and BIST engines'20158,917,566'Bypass structure for a memory device and method to reduce unknown test values'20148,914,688'System and method of reducing test time via address aware BIST circuitry'20148,839,054'Read only memory (ROM) with redundancy'20148,719,648'Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture'20148,612,813'Circuit and method for efficient memory repair'20138,570,820'Selectable repair pass masking'20138,484,543'Fusebay controller structure, system, and method'20138,467,260'Structure and method for storing multiple repair pass data into a fusebay'20138,381,052'Circuit and method for efficient memory repair'20138,239,715'Method and apparatus for a robust embedded interface'20127,954,028'Structure for redundancy programming of a memory device'20117,937,632'Design structure and apparatus for a robust embedded interface'20117,870,454'Structure for system for and method of performing high speed memory diagnostics via built-in-self-test'20117,757,141'Automatically extensible addressing for shared array built-in self-test (ABIST) circuitry'20107,735,031'Method and apparatus for self identification of circuitry'20107,702,976'Integration of LBIST into array BISR flow'20107,702,975'Integration of LBIST into array BISR flow'20107,689,887'Automatic shutdown or throttling of a BIST state machine using thermal feedback'20107,607,060'System and method for performing high speed memory diagnostics via built-in-self-test'20097,549,098'Redundancy programming for a memory device'20097,458,000'Automatic shutdown or throttling of a bist state machine using thermal feedback'20087,194,670'Command multiplier for built-in-self-test'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2020Patents assigned to IBM (31)· patent assignee history
2007–2020Based in Fairfax, VT, US· patent location history
2010–2014Based in Cambridge, VT, US· patent location history
2012–2014Patents assigned to GORMAN KEVIN W (7)· patent assignee history
2012–2014Patents assigned to OUELLETTE MICHAEL R (7)· patent assignee history
2013–2014Patents assigned to ZIEGERHOFER MICHAEL A (3)· patent assignee history
2014–2021Based in Essex, VT, US· patent location history
2017–2018Patents assigned to INVECAS INC (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 31 | 2007–2020 |
| GORMAN KEVIN Wself | 7 | 2012–2014 |
| OUELLETTE MICHAEL R | 7 | 2012–2014 |
| INVECAS INC | 3 | 2017–2018 |
| ZIEGERHOFER MICHAEL A | 3 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Fairfax, VT, US | 26 | 2007–2020 |
| Essex, VT, US | 6 | 2014–2021 |
| Cambridge, VT, US | 4 | 2010–2014 |