Inventor
Tsung-Hsiung Li
Inventor
New Taipei, TW
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables33%
G04FTime-interval measuring11%
G06FElectric digital data processing11%
G11CStatic stores11%
H01LSemiconductor devices11%
H03KPulse technique11%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1011%
PatentTitleYear
10,031,161Method and apparatus for RFID tag testing20189,304,164'Method and apparatus for RFID tag testing'20169,086,452'Three-dimensional integrated circuit and method for wireless information access thereof'20158,947,957'Built-in self repair for memory'20158,629,694'Method and apparatus of voltage scaling techniques'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (4)· patent assignee history
2014–2018Based in New Taipei, TW· patent location history
2015Patents assigned to LI TSUNG-HSIUNG (2)· patent assignee history
2015Patents assigned to CHEN HAO (1)· patent assignee history
2015Patents assigned to CHEN HUAN-NENG (1)· patent assignee history
2015Patents assigned to JOU CHEWN-PU (1)· patent assignee history
2015Based in Hsinchu, TW· patent location history
2015Based in Tu-Cheng, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG | 4 | 2014–2016 |
| LI TSUNG-HSIUNGself | 2 | 2015 |
| CHEN HAO | 1 | 2015 |
| CHEN HUAN-NENG | 1 | 2015 |
| JOU CHEWN-PU | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| New Taipei, TW | 3 | 2014–2018 |
| Hsinchu, TW | 1 | 2015 |
| Tu-Cheng, TW | 1 | 2015 |