Inventor
Dwight A. Sehler
Inventor
Longmont, CO, US
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties100%
PatentTitleYear
8,427,642'Two-dimensional optical imaging methods and systems for particle detection'20138,174,697'Non-orthogonal particle detection systems and methods'20128,154,724'Two-dimensional optical imaging methods and systems for particle detection'20128,027,035'Non-orthogonal particle detection systems and methods'20117,916,293'Non-orthogonal particle detection systems and methods'20117,456,960'Particle counter with improved image sensor array'20087,030,980'Diode pumped intracavity laser particle counter with improved reliability and reduced noise'20066,903,818'Low noise intracavity laser particle counter'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2013Patents assigned to PARTICLE MEASURING SYST (8)· patent assignee history
2005–2013Based in Longmont, CO, US· patent location history
2012–2013Patents assigned to MITCHELL JOHN (3)· patent assignee history
2012–2013Patents assigned to SEHLER DWIGHT A (3)· patent assignee history
2012–2013Patents assigned to RICE DAVID (2)· patent assignee history
2012Patents assigned to SANDBERG JON (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| PARTICLE MEASURING SYST | 8 | 2005–2013 |
| MITCHELL JOHN | 3 | 2012–2013 |
| SEHLER DWIGHT Aself | 3 | 2012–2013 |
| RICE DAVID | 2 | 2012–2013 |
| SANDBERG JON | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Longmont, CO, US | 8 | 2005–2013 |