Inventor
Bryan K. Clark
Inventor
Mountain View, CA, US
Overview
Patents· 35 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Bprimary
G11BInformation storage based on relative movement between record carrier and transducer31%
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
G02BOptical elements, systems or apparatus11%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests11%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light10%
G01BMeasuring length, thickness or similar linear dimensions8%
B82YSpecific uses or applications of nanostructures5%
C23CCoating metallic material2%
G06NComputing arrangements based on specific computational models2%
PatentTitleYear
9,412,074'Optimized trotterization via multi-resolution analysis'20168,436,997'Optical inspection system with polarization isolation of detection system reflections'20137,671,978'Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts'20107,330,277'Resonant ellipsometer and method for determining ellipsometric parameters of a surface'20087,294,825'Fabry-perot resonator apparatus and method including an in-resonator polarizing element'20077,220,955'Three-dimensional imaging resonator and method therefor'20077,214,932'Resonator method and system for distinguishing characteristics of surface features or contaminants'20077,193,725'Method and system for optical measurement via a resonator having a non-uniform phase profile'20077,102,740'Method and system for determining surface feature characteristics using slit detectors'20067,022,978'Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system'20066,927,864'Method and system for determining dimensions of optically recognizable features'20056,879,421'Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator'20056,778,307'Method and system for performing swept-wavelength measurements within an optical system'20046,717,707'Method and system for controlling resonance within a resonator-enhanced optical system'20046,714,295'Optical inspection method and apparatus having an enhanced height sensitivity region and roughness filtering'20046,700,840'Optical storage method and apparatus having enhanced resolution'20046,653,649'Optical measurement and inspection method and apparatus having enhanced optical path difference detection'20036,522,471'System of beam narrowing for resolution enhancement and method therefor'20036,294,058'Enhanced methods and apparatus for producing micro-textured, thin film, magnetic disc media and compositely micro-textured disc media produced thereby'20015,406,544'Low cost substrate for bump-forming recording media'19955,216,658'Enlarged-spot erasure of optical media in dual-beam systems'19935,200,948'Recording method and apparatus'19935,175,720'Interactive optical disk'19925,144,613'Thermal bulk erasure method for dye polymer optical media'19925,090,008'Erasable recording media'19925,088,088'Dye-polymer optical data storage media with improved recording sensitivity'19925,079,758'Single polymer layer recordable/erasable optical media'19925,036,511'Recording method and apparatus'19915,016,239'Recording method and apparatus'19915,014,259'Recording medium having an insulating layer'19915,001,699'Recording method and apparatus'19914,970,711'Bulk eraser for optical memory media'19904,879,709'Dye-polymer optical data storage media with improved recording sensitivity'19894,852,077'Optical data storage media with spatially variable energy absorptivity'19894,792,876'Capstan cleaner for video cassette player/recorder'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988–1993Patents assigned to TANDY CORP (15)· patent assignee history
1988–2001Based in Sunnyvale, CA, US· patent location history
2003Patents assigned to BEYOND 3 (1)· patent assignee history
2003–2013Based in Mountain View, CA, US· patent location history
2004–2005Patents assigned to BEYOND 3 INC (5)· patent assignee history
2005–2013Patents assigned to XYRATEX TECH LTD (10)· patent assignee history
2013Patents assigned to BRUNFELD ANDREI (1)· patent assignee history
2016Based in Santa Barbara, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TANDY CORP | 15 | 1988–1993 |
| XYRATEX TECH LTD | 10 | 2005–2013 |
| BEYOND 3 INC | 5 | 2004–2005 |
| BEYOND 3 | 1 | 2003 |
| BRUNFELD ANDREI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Mountain View, California, US | 17 | 2003–2013 |
| Sunnyvale, California, US | 17 | 1988–2001 |
| Santa Barbara, California, US | 1 | 2016 |