Inventor
Gerhard Hohberg
Inventor
Aalen, DE
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus30%
B23KSoldering or unsoldering23%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light10%
G01DMeasuring not specially adapted for a specific variable7%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
A61BDiagnosis3%
H01RElectrically-conductive connections3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
5,749,745'Adapter connector and camera assembly equipped with said adapter connector'19985,306,892'Mirror objective arrangement'19945,285,320'Mirror for changing the geometrical form of a light beam'19945,164,586'Arrangement for measuring the absorption of transparent specimens mounted within an integrating sphere'19925,159,190'Radiating and receiving arrangement for a fiber-optic sensor having dual sources and detectors'19925,148,326'Mirror for changing the geometrical form of a light beam'19925,138,490'Arrangement for changing the geometrical form of a light beam'19925,077,813'Optical switch'19914,919,535'Reflectance measuring apparatus for making contactless measurements'19904,802,763'Measuring apparatus for characterizing a surface having color directional reflectance properties'19894,756,619'Reflectance measuring apparatus for making contactless measurements'19884,707,596'Articulated optical system having an arrangement for correcting the position of a laser beam'19874,659,916'Arrangement for correcting the position of a laser beam guided by means of an articulated optical system'19874,618,759'Beam position control for a laser machine device'19864,384,769'Illuminating system for test projector'1983Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1983Patents assigned to SCHNEIDER CO OPTISCHE WERKE (1)· patent assignee history
1983Based in Irgisen, DE· patent location history
1986–1998Patents assigned to ZEISS STIFTUNG (14)· patent assignee history
1986–1988Based in Oberkochen, DE· patent location history
1989–1994Based in Aalen-Dewangen, DE· patent location history
1992–1998Based in Aalen, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS STIFTUNG | 14 | 1986–1998 |
| SCHNEIDER CO OPTISCHE WERKE | 1 | 1983 |
Locations
| Location | Patents | Span |
|---|---|---|
| Aalen, DE | 5 | 1992–1998 |
| Aalen-Dewangen, DE | 5 | 1989–1994 |
| Oberkochen, DE | 4 | 1986–1988 |
| Irgisen, DE | 1 | 1983 |