Inventor

Christof Baur

Inventor

Dallas, TX, US

Overview

2003–2021

Patent span

Physics

Primary field (CPC G)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary

G01QScanning-probe techniques or apparatus22%

H01JElectric discharge tubes or discharge lamps16%

B82YSpecific uses or applications of nanostructures10%

G01NInvestigating or analysing materials by determining their chemical or physical properties8%

A61CDentistry6%

G01RMeasuring electric variables6%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%

B82BNanostructures formed by manipulation of individual atoms, molecules, or limited collections of atoms or molecules as discrete units4%

C30BSingle-crystal growth4%

G02BOptical elements, systems or apparatus4%

PatentTitleYear

11,054,439Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode2021 10,983,075Device and method for analysing a defect of a photolithographic mask or of a wafer2021 10,578,644Probe system and method for receiving a probe of a scanning probe microscope2020 10,410,820Beam blanker and method for blanking a charged particle beam2019 10,119,990Scanning probe microscope and method for examining a surface with a high aspect ratio2018 9,995,764Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope2018 9,336,983'Scanning particle microscope and method for determining a position change of a particle beam of the scanning particle microscope'2016 9,115,981'Apparatus and method for investigating an object'2015 8,769,709'Apparatus and method for analyzing and modifying a specimen surface'2014 7,799,132'Patterned atomic layer epitaxy'2010 7,675,300'Charged particle beam device probe operation'2010 7,326,293'Patterned atomic layer epitaxy'2008 7,319,336'Charged particle beam device probe operation'2008 7,285,778'Probe current imaging'2007 7,196,454'Positioning device for microscopic motion'2007 6,987,277'Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces'2006 6,812,460'Nano-manipulation by gyration'2004 6,608,307'System and method for accurate positioning of a scanning probe microscope'2003

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2003–2007Patents assigned to ZYVEX CORP (5)· patent assignee history

2003–2010Based in Dallas, TX, US· patent location history

2008–2010Patents assigned to ZYVEX INSTR LLC (2)· patent assignee history

2008–2010Patents assigned to ZYVEX LABS LLC (2)· patent assignee history

2014–2015Patents assigned to ZEISS CARL SMS GMBH (2)· patent assignee history

2014–2021Based in Darmstadt, DE· patent location history

2015Based in Germany, DE· patent location history

2016–2021Patents assigned to ZEISS CARL SMT GMBH (7)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ZEISS CARL SMT GMBH	7	2016–2021
ZYVEX CORP	5	2003–2007
ZEISS CARL SMS GMBH	2	2014–2015
ZYVEX INSTR LLC	2	2008–2010
ZYVEX LABS LLC	2	2008–2010

Locations

Location	Patents	Span
Dallas, Texas, US	9	2003–2010
Darmstadt, DE	8	2014–2021
Germany, DE	1	2015