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Inventor

Yuji Wakamiya

Inventor
Kobe, JP

Overview

23→
Patents
2010–2020
Patent span
Physics
Primary field (CPC G)

Patents· 23 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties66%
Y10TTechnical subjects covered by former us classification29%
G06FElectric digital data processing6%
PatentTitleYear
10,830,783Sample analysis system, cleaning liquid preparation apparatus, sample analyzer, and cleaning liquid supply method202010,514,376Position adjustment method for movable unit in sample analyzer, and sample analyzer201910,302,666Specimen analyzer and specimen analyzing method20199,915,594'Sample analyzer and a sample analyzing method'20189,606,133'Specimen analyzer and specimen analyzing method'20179,581,608'Sample analyzer and method for controlling sample analyzer'20179,304,140'Sample analyzer'20169,201,083'Sample analyzer and reagent management method'20159,151,703'Sample analyzer and a sample analyzing method'20158,871,147'Sample analyzer and storage medium'20148,778,268'Specimen analyzer, abnormality control method of the same and computer program product'20148,535,607'Sample analyzer'20138,430,321'Sample analyzer and reagent information writing method'20138,425,839'Sample analyzer'20138,366,998'Sample analyzer and sample analyzing method'20138,335,662'Sample analyzer and error information displaying method'20128,329,103'Sample analyzer and method for analyzing samples'20128,279,715'Sample analyzing apparatus'20128,231,830'Sample analyzer'20128,071,029'Sample analyzer and sample analyzing method'20118,040,757'Sample analyzing apparatus'20117,957,935'Analyzer and method of restarting sample measurement'20117,707,010'Sample analyzer and error information displaying method'2010

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2010–2020Patents assigned to SYSMEX CORP (23)· patent assignee history
2010–2020Based in Kobe, JP· patent location history
2011–2017Patents assigned to WAKAMIYA YUJI (14)· patent assignee history
2011–2014Patents assigned to OKUZAKI TOMOHIRO (9)· patent assignee history
2011–2014Patents assigned to TAKEHARA HISATO (9)· patent assignee history
2011–2013Based in Hyogo, JP· patent location history
2013–2017Patents assigned to TOKUNAGA KAZUTOSHI (2)· patent assignee history
2017Based in Kushiro, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SYSMEX CORP232010–2020
WAKAMIYA YUJIself142011–2017
OKUZAKI TOMOHIRO92011–2014
TAKEHARA HISATO92011–2014
TOKUNAGA KAZUTOSHI22013–2017
Locations
LocationPatentsSpan
Kobe, JP182010–2020
Hyogo, JP42011–2013
Kushiro, JP12017