Inventor
Kyong Ha Lee
Inventor
Gyeonggi-do, KR
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores72%
H03KPulse technique6%
H04NPictorial communication, e.g. television6%
A61BDiagnosis3%
G01KMeasuring temperature3%
G01VGeophysics3%
G06FElectric digital data processing3%
H03HImpedance networks, e.g. resonant circuits3%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses3%
PatentTitleYear
9,762,934'Apparatus and method for verifying broadcast content object identification based on web data'20179,601,184'Semiconductor memory and method for operating the same'20179,508,418'Semiconductor device'20169,406,358'Driving circuit and driving method using the same'20169,281,035'Semiconductor integrated circuit capable of controlling read command'20169,269,421'Semiconductor memory and method for operating the same'20168,953,410'Semiconductor integrated circuit capable of controlling read command'20158,699,276'Data transmission circuits and semiconductor memory devices including the same'20148,520,466'Internal command generation circuit'20138,358,558'Address control circuit and semiconductor memory device'20138,254,202'Internal command generation circuit'20128,233,348'Bank active signal generation circuit'20128,068,383'Semiconductor integrated circuit having address control circuit'20118,050,137'Semiconductor integrated circuit capable of controlling read command'20118,027,222'Burst mode control circuit'20118,023,357'Address converting circuit and semiconductor memory device using the same'20117,986,574'Data input circuit technical field'20117,911,868'Self-refresh period measurement circuit of semiconductor device'20117,800,966'Precharge control circuit'20107,764,561'Self-refresh period measurement circuit of semiconductor device'20107,706,195'Strobe signal controlling circuit'20107,633,832'Circuit for outputting data of semiconductor memory apparatus'20097,573,340'Temperature detecting apparatus'20097,551,504'Apparatus and method of detecting refresh cycle of semiconductor memory'20097,548,478'Circuit and method for selecting test self-refresh period of semiconductor memory device'20097,486,583'Self-refresh period measurement circuit of semiconductor device'20097,301,841'Circuit and method for selecting test self-refresh period of semiconductor memory device'20075,272,627'Data converter for CT data acquisition system'19934,707,673'Directional coupling transformer for bi-directional full duplex data bus'19874,692,909'Adaptive seismic signal processor'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–1993Patents assigned to GULTON IND INC (2)· patent assignee history
1987Patents assigned to AMOCO CORP (1)· patent assignee history
1987–1993Based in Albuquerque, NM, US· patent location history
2007–2013Patents assigned to HYNIX SEMICONDUCTOR INC (18)· patent assignee history
2007–2011Based in Ichon-shi, KR· patent location history
2009–2017Based in Gyeonggi-do, KR· patent location history
2009–2011Based in Suwon-si, KR· patent location history
2010–2016Based in Yongin-si, KR· patent location history
2011–2015Patents assigned to LEE KYONG HA (7)· patent assignee history
2013–2017Patents assigned to SK HYNIX INC (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HYNIX SEMICONDUCTOR INC | 18 | 2007–2013 |
| SK HYNIX INC | 8 | 2013–2017 |
| LEE KYONG HAself | 7 | 2011–2015 |
| GULTON IND INC | 2 | 1987–1993 |
| AMOCO CORP | 1 | 1987 |
Locations
| Location | Patents | Span |
|---|---|---|
| Gyeonggi-do, KR | 10 | 2009–2017 |
| Yongin-si, KR | 9 | 2010–2016 |
| Ichon-shi, KR | 3 | 2007–2011 |
| Suwon-si, KR | 3 | 2009–2011 |
| Albuquerque, NM, US | 3 | 1987–1993 |