Inventor
Mingqi Li
Inventor
Shrewsbury, MA, US
Overview
Patents· 72 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices19%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
C09DCoating compositions, e.g. paints, varnishes or lacquers9%
H01LSemiconductor devices8%
C08FMacromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds7%
C07CAcyclic or carbocyclic compounds6%
C08GMacromolecular compounds obtained otherwise than by reactions only involving unsaturated carbon-to-carbon bonds5%
C08LCompositions of macromolecular compounds5%
C07DHeterocyclic compounds5%
H10DInorganic electric semiconductor devices3%
PatentTitleYear
10,992,386Method for implementing variable optical splitter and variable optical splitter202110,985,860Method for managing multi-wavelength passive optical network, and optical module202110,887,160Management method for home network device and network management system202110,809,616Cholate photoacid generators and photoresists comprising same202010,719,014Photoresists comprising amide component202010,684,549Pattern-formation methods202010,670,965Polymers and photoresist compositions202010,578,969Photoresist topcoat compositions and methods of processing photoresist compositions202010,481,495Topcoat compositions containing fluorinated thermal acid generators201910,287,455Methods for manufacturing block copolymers and articles manufactured therefrom201910,241,411Topcoat compositions containing fluorinated thermal acid generators201910,241,407Thermal acid generators and photoresist pattern trimming compositions and methods201910,197,918Photoresist topcoat compositions and methods of processing photoresist compositions201910,167,411Neutral layer polymers, methods of manufacture thereof and articles comprising the same201910,162,265Pattern treatment methods201810,133,179Pattern treatment methods201810,114,288Silicon-containing underlayers201810,042,259Topcoat compositions and pattern-forming methods201810,042,255Block copolymers and pattern treatment compositions and methods201810,031,420Wet-strippable silicon-containing antireflectant201810,007,179Thermal acid generators and photoresist pattern trimming compositions and methods201810,007,184Silicon-containing underlayers20189,880,469'Resins for underlayers'20189,809,672'Aromatic resins for underlayers'20179,802,400'Orientation control layer formed on a free top surface of a first block copolymer from a mixture of first and second block copolymers'20179,735,023'Methods for manufacturing block copolymer compositions and articles manufactured therefrom'20179,720,321'Lactone photoacid generators and resins and photoresists comprising same'20179,703,203'Compositions and methods for pattern treatment'20179,684,241'Compositions and methods for pattern treatment'20179,671,689'Cholate photoacid generators and photoresists comprising same'20179,671,697'Pattern treatment methods'20179,663,682'Methods for manufacturing block copolymers and articles manufactured therefrom'20179,665,005'Pattern treatment methods'20179,601,325'Aromatic resins for underlayers'20179,558,987'Gap-fill methods'20179,540,476'Aromatic resins for underlayers'20179,511,475'Polishing device for removing polishing byproducts'20169,507,259'Photoresist composition'20169,508,549'Methods of forming electronic devices including filling porous features with a polymer'20169,442,377'Wet-strippable silicon-containing antireflectant'20169,436,082'Compositions comprising base-reactive component and processes for photolithography'20169,406,527'Semiconductor device manufacturing method and related semiconductor wafer'20169,382,444'Neutral layer polymers, methods of manufacture thereof and articles comprising the same'20169,348,220'Photoacid generators and photoresists comprising same'20169,255,079'Photoacid generators and photoresists comprising same'20169,209,067'Gap-fill methods'20159,196,697'Semiconductor device with an aluminum alloy gate'20159,156,785'Base reactive photoacid generators and photoresists comprising same'20159,146,470'Photoacid generator and photoresist comprising same'20159,128,372'Dendritic compounds, photoresist compositions and methods of making electronic devices'20159,110,369'Photoacid generator, photoresist, coated substrate, and method of forming an electronic device'20159,045,506'Diphosphonate compound and a method for preparing the same and an application of the same'20159,046,767'Photoacid generator, photoresist, coated substrate, and method of forming an electronic device'20159,029,065'Photoacid generating compound and photoresist composition comprising same, coated article comprising the photoresist and method of making an article'20158,956,799'Photoacid generator and photoresist comprising same'20158,900,794'Photoacid generator and photoresist comprising same'20148,858,817'Polishing apparatus and exception handling method thereof'20148,851,959'Chemical mechanical polishing device and polishing element'20148,846,535'Method of fabricating a semiconductor device'20148,815,728'Semiconductor device having metal alloy gate and method for manufacturing the same'20148,808,063'Method for removing polishing byproducts and polishing device'20148,790,861'Cycloaliphatic monomer, polymer comprising the same, and photoresist composition comprising the polymer'20148,777,026'Crane jib transition structure'20148,758,090'Polishing method and polishing device'20148,748,279'Method of manufacturing a semiconductor device'20148,721,401'Method for cleaning a polishing pad'20148,603,728'Polymer composition and photoresist comprising the polymer'20138,541,308'Polishing method and method for forming a gate'20138,507,336'Method for forming metal gate and MOS transistor'20138,338,077'Photoacid generators and photoresists comprising same'20128,313,991'Method for fabricating a high-K metal gate MOS'20126,842,937'Rain-gutter cleaning tool set'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2020Patents assigned to LI MINGQI (24)· patent assignee history
2012–2020Patents assigned to ROHM & HAAS ELECT MAT (51)· patent assignee history
2012–2014Patents assigned to JIANG LI (10)· patent assignee history
2012–2020Patents assigned to LIU CONG (9)· patent assignee history
2012–2020Based in Shrewsbury, MA, US· patent location history
2012–2016Based in Shanghai, CN· patent location history
2014Based in Beijing, CN· patent location history
2015–2019Patents assigned to DOW GLOBAL TECHNOLOGIES LLC (16)· patent assignee history
2016–2020Based in Marlborough, MA, US· patent location history
2021Based in Shenzhen, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ROHM & HAAS ELECT MAT | 51 | 2012–2020 |
| LI MINGQIself | 24 | 2005–2020 |
| DOW GLOBAL TECHNOLOGIES LLC | 16 | 2015–2019 |
| JIANG LI | 10 | 2012–2014 |
| LIU CONG | 9 | 2012–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Shrewsbury, Massachusetts, US | 48 | 2012–2020 |
| Shanghai, CN | 13 | 2012–2016 |
| Marlborough, Massachusetts, US | 4 | 2016–2020 |
| Shenzhen, CN | 3 | 2021 |
| Beijing, CN | 2 | 2014 |