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Inventor

Takashi Miida

Inventor
Kanagawa, JP

Overview

48→
Patents
1984–2015
Patent span
Electricity
Primary field (CPC H)

Patents· 48 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Fprimary
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation20%
H04NPictorial communication, e.g. television15%
H10BElectronic memory devices15%
H10DInorganic electric semiconductor devices14%
G02BOptical elements, systems or apparatus13%
G11CStatic stores13%
H03KPulse technique3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light1%
G01SRadio direction-finding1%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them1%
PatentTitleYear
9,214,242'Programming method for NAND flash memory device to reduce electrons in channels'20158,599,614'Programming method for NAND flash memory device to reduce electrons in channels'20138,334,164'Image sensor and fabrication method thereof'20127,679,157'Image sensor and fabrication method thereof'20107,279,384'Semiconductor memory and method for manufacturing the same'20077,256,443'Semiconductor memory and method of manufacturing the same'20077,221,029'Semiconductor device and semiconductor memory using the same'20077,037,782'Semiconductor memory having storage cells storing multiple bits and a method of manufacturing the same'20066,984,863'Semiconductor decive and semiconductor memory using the same'20066,950,134'Method of preventing transfer and storage of non-optically generated charges in solid state imaging device'20056,944,062'Transistor and semiconductor memory using the same'20056,937,525'Semiconductor memory having storage cells storing multiple bits and a method of driving the same'20056,812,518'Semiconductor memory having storage cells storing multiple bits and a method of manufacturing the same'20046,768,093'Solid state imaging device and driving method thereof'20046,747,264'Changeable gain amplifier, solid-state imaging device and optical signal reading method'20046,677,627'Solid state imaging device, method of manufacturing the same, and solid state imaging system'20046,656,777'Solid state imaging device, method of manufacturing the same, and solid state imaging system'20036,653,164'Solid state imaging device, manufacturing method thereof, and solid state imaging apparatus'20036,545,331'Solid state imaging device, manufacturing method thereof, and solid state imaging apparatus'20036,538,925'Semiconductor memory device, method of manufacturing the same and method of driving the same'20036,512,547'Solid-state imaging device and method of detecting optical signals using the same'20036,504,194'Solid state imaging device, method of manufacturing the same, and solid state imaging system'20036,476,371'Solid state imaging device and driving method thereof'20026,448,596'Solid-state imaging device'20026,423,958'Solid state imaging device and method of driving the same'20026,051,857'Solid-state imaging device and method of detecting optical signals using the same'20005,777,675'Automatic light measuring device for image pickup device'19985,568,249'Phase difference detection type rangefinder and method of measuring subject distance'19965,376,992'Photocurrent charge type exposure measuring apparatus'19945,359,383'Automatic focusing system with phase difference detecting unit employing correlation operating circuit'19945,357,310'Correlation phase difference type focus detecting interpolation'19945,285,234'Phase difference detecting type autofocusing device including an optical system having first and second lenses'19945,252,868'CMOS amplifier circuit and CCD delay line with CMOS amplifier'19935,115,155'CCD delay line'19925,068,738'Phase-difference detector using an analog arithmetic correlation device'19915,038,214'Peak level detecting apparatus for image sensors which prevents saturation'19915,008,696'Phase difference detecting apparatus'19915,006,928'Image processing method in an electronic video endoscopy system'19914,959,726'Automatic focusing adjusting device'19904,945,377'Phase difference detecting apparatus'19904,926,205'Phase-difference detector'19904,849,619'Phase difference detector with analog signals'19894,833,636'Analog, two signal correlator'19894,803,706'Variable delay charge coupled device'19894,750,042'Solid state image pickup element with dual horizontal transfer sections'19884,716,466'Image sensor'19874,672,409'Nonvolatile semiconductor memory device'19874,462,089'Nonvolatile semiconductor memory device'1984

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1984–1987Patents assigned to FUJITSU LTD (3)· patent assignee history
1984–2015Based in Tokyo, JP· patent location history
1988–1998Patents assigned to FUJI PHOTO FILM CO LTD (19)· patent assignee history
1988–2007Based in Kanagawa, JP· patent location history
1994–1998Based in Miyagi, JP· patent location history
2000–2003Patents assigned to INNOVISION INC (2)· patent assignee history
2002–2007Patents assigned to INNOTECH CORP (19)· patent assignee history
2007Based in Yokohama, JP· patent location history
2010–2012Based in Hsinchu, TW· patent location history
2012–2015Patents assigned to POWERCHIP TECHNOLOGY CORP (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJI PHOTO FILM CO LTD191988–1998
INNOTECH CORP192002–2007
FUJITSU LTD31984–1987
POWERCHIP TECHNOLOGY CORP32012–2015
INNOVISION INC22000–2003
Locations
LocationPatentsSpan
Kanagawa, JP351988–2007
Tokyo, JP51984–2015
Miyagi, JP31994–1998
Hsinchu, TW22010–2012
Yokohama, JP12007