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Inventor

Jaime D. Morillo

Inventor
Beacon, NY, US

Overview

9→
Patents
2005–2015
Patent span
Physics
Primary field (CPC G)

Patents· 9 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices69%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
G06FElectric digital data processing8%
H01LSemiconductor devices8%
PatentTitleYear
9,097,989'Target and method for mask-to-wafer CD, pattern placement and overlay measurement and control'20159,087,740'Fabrication of lithographic image fields using a proximity stitch metrology'20158,339,605'Multilayer alignment and overlay target and measurement method'20128,107,079'Multi layer alignment and overlay target and measurement method'20127,876,439'Multi layer alignment and overlay target and measurement method'20117,626,702'Overlay target and measurement method using reference and sub-grids'20097,474,401'Multi-layer alignment and overlay target and measurement method'20097,359,054'Overlay target and measurement method using reference and sub-grids'20086,937,337'Overlay target and measurement method using reference and sub-grids'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005–2015Patents assigned to IBM (9)· patent assignee history
2005–2009Based in Wappingers Falls, NY, US· patent location history
2009–2015Based in Beacon, NY, US· patent location history
2012–2015Patents assigned to AUSSCHNITT CHRISTOPHER P (3)· patent assignee history
2012–2015Patents assigned to MORILLO JAIME D (3)· patent assignee history
2012Patents assigned to BINNS LEWIS A (2)· patent assignee history
2012Patents assigned to NANOMETRICS INC (2)· patent assignee history
2015Based in Cedar Park, TX, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM92005–2015
AUSSCHNITT CHRISTOPHER P32012–2015
MORILLO JAIME Dself32012–2015
BINNS LEWIS A22012
NANOMETRICS INC22012
Locations
LocationPatentsSpan
Beacon, New York, US52009–2015
Wappingers Falls, New York, US32005–2009
Cedar Park, Texas, US12015