Inventor
MASAMI MAKUUCHI
Inventor
JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties39%
A61BDiagnosis6%
G01RMeasuring electric variables6%
G01SRadio direction-finding6%
G01VGeophysics6%
G01WMeteorology6%
G02BOptical elements, systems or apparatus6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices6%
H01LSemiconductor devices6%
H01QAntennas, i.e. radio aerials6%
PatentTitleYear
12,422,377Defect inspection apparatus and defect inspection method202512,276,618Defect inspection device202512,044,627Defect inspection device and defect inspection method202411,346,791Inspection device and inspection method thereof202211,199,511Medium sensor device and monitoring system202111,143,598Defect inspection apparatus and defect inspection method202111,143,600Defect inspection device2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to HITACHI HIGH TECH CORP (6)· patent assignee history
2021Patents assigned to HITACHI LTD (1)· patent assignee history
2021–2025Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 6 | 2021–2025 |
| HITACHI LTD | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 7 | 2021–2025 |