Inventor
Forrest Frank Hopkins
Inventor
Cohoes, NY, US
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis16%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
G21KHandling of particles or ionising radiation not otherwise provided for14%
B82YSpecific uses or applications of nanostructures10%
G01VGeophysics10%
G06TImage data processing or generation, in general10%
H01JElectric discharge tubes or discharge lamps8%
G01TMeasurement of nuclear or x-radiation4%
A61NElectrotherapy2%
G01BMeasuring length, thickness or similar linear dimensions2%
PatentTitleYear
8,744,048'Integrated X-ray source having a multilayer total internal reflection optic device'20148,311,184'Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices'20128,208,602'High flux photon beams using optic devices'20128,184,767'Imaging system and method with scatter correction'20128,045,776'Geometry-dependent filtering in CT method and apparatus'20117,889,835'System and method for detecting an object by dynamically adjusting computational load'20117,869,566'Integrated multi-sensor systems for and methods of explosives detection'20117,809,103'Method for detecting the presence of high atomic number elements'20107,742,566'Multi-energy imaging system and method using optic devices'20107,706,502'Cargo container inspection system and apparatus'20107,522,756'Method, system and apparatus for processing radiographic images of scanned objects'20097,508,911'X-ray imaging system and methods of using and forming an array of optic devices therein'20097,492,855'System and method for detecting an object'20097,483,511'Inspection system and method'20097,412,131'Multilayer optic device and system and method for making same'20087,366,374'Multilayer optic device and an imaging system and method using same'20087,236,564'Linear array detector system and inspection method'20077,218,706'Energy discrimination radiography systems and methods for inspecting industrial components'20077,215,801'Method, system and apparatus for processing radiographic images of scanned objects'20077,215,732'Method and system for CT reconstruction with pre-correction'20077,214,947'Detector assembly and method of manufacture'20077,203,269'System for forming x-rays and method for using same'20077,065,234'Scatter and beam hardening correction in computed tomography applications'20066,826,255'X-ray inspection system and method of operating'20044,725,963'Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988Based in Austin, TX, US· patent location history
2004–2014Patents assigned to GEN ELECTRIC (20)· patent assignee history
2004–2011Based in Scotia, NY, US· patent location history
2007–2014Based in Cohoes, NY, US· patent location history
2010–2011Patents assigned to MORPHO DETECTION INC (3)· patent assignee history
2012–2014Patents assigned to HOPKINS FORREST FRANK (4)· patent assignee history
2012–2014Patents assigned to EDIC PETER MICHAEL (3)· patent assignee history
2012–2014Patents assigned to LEE SUSANNE MADELINE (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 20 | 2004–2014 |
| HOPKINS FORREST FRANKself | 4 | 2012–2014 |
| EDIC PETER MICHAEL | 3 | 2012–2014 |
| LEE SUSANNE MADELINE | 3 | 2012–2014 |
| MORPHO DETECTION INC | 3 | 2010–2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cohoes, New York, US | 15 | 2007–2014 |
| Scotia, New York, US | 9 | 2004–2011 |
| Austin, Texas, US | 1 | 1988 |