Inventor
Mattia Robustelli
Inventor
Milan, IT
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores43%
G06FElectric digital data processing11%
G01RMeasuring electric variables7%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy7%
H02JElectric power networks7%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution7%
H01LSemiconductor devices4%
H10BElectronic memory devices4%
H10DInorganic electric semiconductor devices4%
H10NElectric solid-state devices not otherwise provided for4%
PatentTitleYear
11,105,862Methods and systems for assessing multicell battery health202111,063,448Methods and system for dynamically modifying charging settings for a battery assembly202111,037,613Implementations to store fuse data in memory devices202110,854,813Dopant-modulated etching for memory devices202010,755,781Techniques for programming multi-level self-selecting memory cell202010,658,034Dedicated read voltages for data structures202010,043,576Phase change memory devices and systems having reduced voltage threshold drift and associated methods20189,627,055'Phase change memory devices and systems having reduced voltage threshold drift and associated methods'20179,583,185'Phase change memory devices and systems having reduced voltage threshold drift and associated methods'20179,349,481'Semiconductor memory device and method of operating the same'20169,111,631'Reading memory cell history during program operation for adaptive programming'20158,773,907'Reading memory cell history during program operation for adaptive programming'20148,705,287'Semiconductor memory device and method of operating the same'20148,451,662'Reading memory cell history during program operation for adaptive programming'20138,274,832'Dynamic polarization for reducing stress induced leakage current'20127,940,568'Dynamic polarization for reducing stress induced leakage current'2011Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2011–2021Patents assigned to MICRON TECHNOLOGY INC (9)· patent assignee history
2011–2021Based in Milan, IT· patent location history
2012–2014Patents assigned to ROBUSTELLI MATTIA (3)· patent assignee history
2012–2014Patents assigned to VISCONTI ANGELO (3)· patent assignee history
2014–2016Patents assigned to SK HYNIX INC (2)· patent assignee history
2017–2018Patents assigned to INTEL CORP (2)· patent assignee history
2021Based in Smithtown, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRON TECHNOLOGY INC | 9 | 2011–2021 |
| ROBUSTELLI MATTIAself | 3 | 2012–2014 |
| VISCONTI ANGELO | 3 | 2012–2014 |
| INTEL CORP | 2 | 2017–2018 |
| SK HYNIX INC | 2 | 2014–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Milan, IT | 14 | 2011–2021 |
| Smithtown, New York, US | 2 | 2021 |