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Inventor

Enrico Novarini

Inventor
Certosa di Pavia, IT

Overview

2→
Patents
1994–2001
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables25%
G05FSystems for regulating electric or magnetic variables25%
H03FAmplifiers25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests25%
PatentTitleYear
6,236,225'Method of testing the gate oxide in integrated DMOS power transistors and integrated device comprising a DMOS power transistor'20015,350,998'Structure for temperature compensating the inverse saturation current of bipolar transistors'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994Patents assigned to SGS THOMSON MICROELECTRONICS (1)· patent assignee history
1994–2001Based in Certosa di Pavia, IT· patent location history
2001Patents assigned to ST MICROELECTRONICS SRL (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SGS THOMSON MICROELECTRONICS11994
ST MICROELECTRONICS SRL12001
Locations
LocationPatentsSpan
Certosa di Pavia, IT21994–2001