Inventor
Mincent Lee
Inventor
Taipei, TW
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
G01BMeasuring length, thickness or similar linear dimensions38%
G11CStatic stores13%
PatentTitleYear
10,641,819Alignment testing for tiered semiconductor structure202010,073,135Alignment testing for tiered semiconductor structure20189,915,699'Integrated fan-out pillar probe system'20189,658,281'Alignment testing for tiered semiconductor structure'20178,095,832'Method for repairing memory and system thereof'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012Patents assigned to LEE MINCENT (1)· patent assignee history
2012Patents assigned to NAT UNIV TSING HUA (1)· patent assignee history
2012Patents assigned to WU CHENG WEN (1)· patent assignee history
2012–2020Based in Taipei, TW· patent location history
2017–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 4 | 2017–2020 |
| LEE MINCENTself | 1 | 2012 |
| NAT UNIV TSING HUA | 1 | 2012 |
| WU CHENG WEN | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Taipei, TW | 5 | 2012–2020 |