Inventor
Kenichi Nagatani
Inventor
Tokyo, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables56%
G06KGraphical data reading11%
G11CStatic stores11%
H04LTransmission of digital information, e.g. telegraphic communication11%
H04NPictorial communication, e.g. television11%
PatentTitleYear
8,599,910'Jitter addition apparatus and test apparatus'20138,145,965'Test apparatus for testing a device under test and device for receiving a signal'20128,140,290'Transmission characteristics measurement apparatus, transmission characteristics measurement method, and electronic device'20128,090,009'Test apparatus'20127,801,205'Jitter injection circuit, electronics device, and test apparatus'20105,399,850'Document reading apparatus, having a body unit for holding apparatus components'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995Patents assigned to KYOCERA CORP (1)· patent assignee history
1995Based in Kokubu, JP· patent location history
2010–2013Patents assigned to ADVANTEST CORP (5)· patent assignee history
2010–2012Based in Tokyo, JP· patent location history
2012–2013Patents assigned to NAGATANI KENICHI (4)· patent assignee history
2012Patents assigned to ISHIDA MASAHIRO (1)· patent assignee history
2012Patents assigned to NAKAGAWA HIROSHI (1)· patent assignee history
2012–2013Based in Gunma, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANTEST CORP | 5 | 2010–2013 |
| NAGATANI KENICHIself | 4 | 2012–2013 |
| ISHIDA MASAHIRO | 1 | 2012 |
| KYOCERA CORP | 1 | 1995 |
| NAKAGAWA HIROSHI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 2010–2012 |
| Gunma, JP | 2 | 2012–2013 |
| Kokubu, JP | 1 | 1995 |