Inventor
Kwan-Woo Ryu
Inventor
Suwon-si, KR
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1042%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G01BMeasuring length, thickness or similar linear dimensions17%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light8%
G01RMeasuring electric variables8%
PatentTitleYear
9,417,055'Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film'20169,255,789'Method for measuring thickness of object'20168,551,791'Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis'20137,186,577'Method for monitoring a density profile of impurities'20076,927,077'Method and apparatus for measuring contamination of a semiconductor substrate'20056,869,215'Method and apparatus for detecting contaminants in ion-implanted wafer'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2016Patents assigned to SAMSUNG ELECTRONICS CO LTD (5)· patent assignee history
2005–2007Based in Suwon-si, KR· patent location history
2013Patents assigned to JUN CHUNG-SAM (1)· patent assignee history
2013Patents assigned to KIM JI-HYE (1)· patent assignee history
2013Patents assigned to PARK HWAN-SHIK (1)· patent assignee history
2013Patents assigned to PARK JANG-IK (1)· patent assignee history
2013Based in Hwaseong-si, KR· patent location history
2016Based in Seoul, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 5 | 2005–2016 |
| JUN CHUNG-SAM | 1 | 2013 |
| KIM JI-HYE | 1 | 2013 |
| PARK HWAN-SHIK | 1 | 2013 |
| PARK JANG-IK | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Suwon-si, KR | 3 | 2005–2007 |
| Seoul, KR | 2 | 2016 |
| Hwaseong-si, KR | 1 | 2013 |