Inventor

Keith A. Jenkins

Inventor

Sleepy Hollow, NY, US

Overview

1996–2021

Patent span

Physics

Primary field (CPC G)

Patents· 76 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables27%

G06FElectric digital data processing9%

H10DInorganic electric semiconductor devices8%

H04LTransmission of digital information, e.g. telegraphic communication6%

H03KPulse technique5%

H01LSemiconductor devices4%

G01KMeasuring temperature3%

H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses3%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%

G11CStatic stores3%

PatentTitleYear

11,131,706Degradation monitoring of semiconductor chips2021 11,105,856Detection of performance degradation in integrated circuits2021 10,782,336BTI degradation test circuit2020 10,746,785Dynamic predictor of semiconductor lifetime limits2020 10,739,391Duty cycle measurement2020 10,671,958Analytics to determine customer satisfaction2020 10,574,240Ring oscillator structures to determine local voltage value2020 10,564,213Dielectric breakdown monitor2020 10,552,278Non-destructive analysis to determine use history of processor2020 10,491,610Remote monitoring of software2019 10,433,173Touch movement activation for gaining access beyond a restricted access gateway2019 10,388,580On-chip combined hot carrier injection and bias temperature instability monitor2019 10,365,702Autonomic supply voltage compensation for degradation of circuits over circuit lifetime2019 10,360,526Analytics to determine customer satisfaction2019 10,295,589Electromigration wearout detection circuits2019 10,247,769Measuring individual device degradation in CMOS circuits2019 10,102,090Non-destructive analysis to determine use history of processor2018 10,075,131Ultra-broadband switched inductor oscillator2018 10,002,810On-chip combined hot carrier injection and bias temperature instability monitor2018 9,952,274Measurement for transistor output characteristics with and without self heating2018 9,906,960'Touch movement activation for gaining access beyond a restricted access gateway'2018 9,866,221'Test circuit to isolate HCI degradation'2018 9,863,994'On-chip leakage measurement'2018 9,835,583Remote sensing using pulse-width modulation2017 9,835,584Remote sensing using pulse-width modulation2017 9,829,535Test structure to measure delay variability mismatch of digital logic paths2017 9,817,047'Duty cycle measurement'2017 9,791,500'Circuit to detect previous use of computer chips using passive test wires'2017 9,791,499'Circuit to detect previous use of computer chips using passive test wires'2017 9,787,473'Carbon nanotube array for cryptographic key generation and protection'2017 9,746,386'Apparatus and methods for measurements of pressure'2017 9,702,924'Simultaneously measuring degradation in multiple FETs'2017 9,692,397'Carbon based CMOS sensor ring oscillator'2017 9,678,141'Measurement for transistor output characteristics with and without self heating'2017 9,660,806'Carbon nanotube array for cryptographic key generation and protection'2017 9,276,524'High frequency oscillator circuit'2016 9,110,777'Reducing performance degradation in backup semiconductor chips'2015 D0730762'Pressure strap'2015 8,987,693'High density memory device'2015 D0718164'Wireless pressure strap'2014 D0718163'Pressure strap'2014 8,890,542'On-chip measurement of AC variability in individual transistor devices'2014 8,829,922'On-chip measurement of AC variability in individual transistor devices'2014 8,816,787'High frequency oscillator circuit and method to operate same'2014 8,729,920'Circuit and method for RAS-enabled and self-regulated frequency and delay sensor'2014 8,362,477'High density memory device'2013 8,106,383'Self-aligned graphene transistor'2012 8,004,305'Electronic circuit for measurement of transistor variability and the like'2011 7,880,518'Method and apparatus for measuring and compensating for static phase error in phase locked loops'2011 7,863,918'Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits'2011 7,821,301'Method and apparatus for measuring and compensating for static phase error in phase locked loops'2010 7,791,330'On-chip jitter measurement circuit'2010 7,780,347'On chip temperature measuring and monitoring circuit and method'2010 7,768,848'On-chip characterization of noise-margins for memory arrays'2010 7,764,080'Methods of operating an electronic circuit for measurement of transistor variability and the like'2010 7,762,721'On chip temperature measuring and monitoring method'2010 7,688,058'Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics'2010 7,645,071'On chip temperature measuring and monitoring method'2010 7,538,652'Electrical component tuned by conductive layer deletion'2009 7,452,128'On chip temperature measuring and monitoring circuit and method'2008 7,446,523'Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics'2008 7,443,187'On-chip power supply noise detector'2008 7,439,755'Electronic circuit for measurement of transistor variability and the like'2008 7,439,724'On-chip jitter measurement circuit'2008 7,378,831'System and method for determining a delay time interval of components'2008 7,355,429'On-chip power supply noise detector'2008 7,255,476'On chip temperature measuring and monitoring circuit and method'2007 7,218,091'Integrated CMOS spectrum analyzer for on-chip diagnostics using digital autocorrelation of coarsely quantized signals'2007 7,170,310'System and method using locally heated island for integrated circuit testing'2007 7,116,092'Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics'2006 7,095,264'Programmable jitter signal generator'2006 7,033,927'Apparatus and method for thermal isolation, circuit cooling and electromagnetic shielding of a wafer'2006 6,441,602'Method and apparatus for determining phase locked loop jitter'2002 5,936,299'Substrate contact for integrated spiral inductors'1999 5,656,849'Two-level spiral inductor structure having a high inductance to area ratio'1997 5,485,029'On-chip ground plane for semiconductor devices to reduce parasitic signal propagation'1996

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1996–2021Patents assigned to IBM (72)· patent assignee history

1996–1999Based in Tarrytown, NY, US· patent location history

2002–2021Based in Sleepy Hollow, NY, US· patent location history

2012–2016Patents assigned to JENKINS KEITH A (9)· patent assignee history

2012–2016Patents assigned to LIN YU-MING (3)· patent assignee history

2012Based in Yorktown Heights, NY, US· patent location history

2014–2015Patents assigned to ADVANCED SENSOR DESIGN TECHNOLOGIES LLC (3)· patent assignee history

2014Patents assigned to BALAKRISHNAN KARTHIK (2)· patent assignee history

2014–2017Based in Houston, TX, US· patent location history

2021Based in New York, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
IBM	72	1996–2021
JENKINS KEITH Aself	9	2012–2016
ADVANCED SENSOR DESIGN TECHNOLOGIES LLC	3	2014–2015
LIN YU-MING	3	2012–2016
BALAKRISHNAN KARTHIK	2	2014

Locations

Location	Patents	Span
Sleepy Hollow, New York, US	67	2002–2021
Houston, Texas, US	4	2014–2017
Tarrytown, New York, US	3	1996–1999
New York, New York, US	1	2021
Yorktown Heights, New York, US	1	2012