Inventor
Tsung-Hsun Chiang
Inventor
Hsinchu, TW
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices26%
H10HInorganic light-emitting semiconductor devices having potential barriers26%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1015%
LOC1313%
H05KPrinted circuits4%
F21KNon-electric light sources using luminescence2%
F21VFunctional features or details of lighting devices or systems thereof2%
F21YIndexing scheme associated with subclasses f21k, f21l, f21s and f21v, relating to the form or the kind of the light sources or of the colour of the light emitted2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G01MTesting static or dynamic balance of machines or structures2%
PatentTitleYear
10,991,854Light-emitting element with crack preventing cushion202110,985,295Light-emitting device202110,749,075Semiconductor light-emitting device202010,680,138Light-emitting device202010,411,162Semiconductor light-emitting device including penetrating trenches201910,361,342Light-emitting device201910,297,723Light emitting device201910,199,544Light emitting device201910,153,402Light-emitting element2018D0824864Light-emitting diode unit20189,893,241'Light emitting device having bonding pads formed therein for packaging'20189,761,774'Light-emitting element with protective cushioning'2017D0777693'Light-emitting diode unit'2017D0769831'Light-emitting diode unit'2016D0769199'Light-emitting diode unit'20169,461,209'Semiconductor light-emitting device'2016D0768094'Light-emitting diode unit'2016D0752527'Light-emitting diode device'20168,872,829'System and method for processing frequency spectrum of a signal in an image file'20148,553,424'Locking device and electronic device enclosure using the same'20138,441,781'Vibration dampening structure for electronic device'20138,297,105'Impact testing device and impact testing method using the same'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2014Patents assigned to CHIANG TSUNG-HSUN (4)· patent assignee history
2012–2014Patents assigned to HON HAI PREC IND CO LTD (4)· patent assignee history
2012–2013Based in Taipei, TW· patent location history
2013Based in Tu-Cheng, TW· patent location history
2014Patents assigned to LIN SHENG-HAN (1)· patent assignee history
2014Based in New Taipei, TW· patent location history
2016–2021Patents assigned to EPISTAR CORP (18)· patent assignee history
2016–2021Based in Hsinchu, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| EPISTAR CORP | 18 | 2016–2021 |
| CHIANG TSUNG-HSUNself | 4 | 2012–2014 |
| HON HAI PREC IND CO LTD | 4 | 2012–2014 |
| LIN SHENG-HAN | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 18 | 2016–2021 |
| Taipei, TW | 2 | 2012–2013 |
| New Taipei, TW | 1 | 2014 |
| Tu-Cheng, TW | 1 | 2013 |