Inventor
Yoshito Yoneyama
Inventor
Kawasaki, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices15%
G05BControl or regulating systems in general12%
G08BSignalling systems, e.g. personal calling systems12%
Y02PClimate change mitigation technologies in the production or processing of goods12%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
B01LChemical or physical laboratory apparatus for general use7%
B41JTypewriters5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form2%
PatentTitleYear
11,104,172Intermediate transfer medium, combination of intermediate transfer medium and thermal transfer sheet, and method for forming print20217,805,279'Remote maintenance system'20107,062,343'Remote maintenance system'20066,963,786'Remote maintenance system'20056,892,109'Remote maintenance system'20056,801,913'Medical instrument control system'20046,385,497'Remote maintenance system'20025,871,587'Processing system for semiconductor device manufacture of otherwise'19995,828,572'Processing System and semiconductor device production method using the same including air conditioning control in operational zones'19985,599,502'Liquid moving apparatus and measuring apparatus utilizing the same'19975,370,842'Sample measuring device and sample measuring system'19945,275,787'Apparatus for separating or measuring particles to be examined in a sample fluid'19945,182,617'Sample supply device and sample inspection apparatus using the device'19935,180,065'Apparatus for and method of fractionating particle in particle-suspended liquid in conformity with the properties thereof'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2010Patents assigned to CANON KK (13)· patent assignee history
1993–2010Based in Kawasaki, JP· patent location history
2004Based in Tochigi, JP· patent location history
2021Patents assigned to DAINIPPON PRINTING CO LTD (1)· patent assignee history
2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CANON KK | 13 | 1993–2010 |
| DAINIPPON PRINTING CO LTD | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 12 | 1993–2010 |
| Tokyo, JP | 1 | 2021 |
| Tochigi, JP | 1 | 2004 |