Inventor
Frank Klemm
Inventor
Jena, DE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus40%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light20%
G05BControl or regulating systems in general20%
G01DMeasuring not specially adapted for a specific variable10%
G06TImage data processing or generation, in general10%
PatentTitleYear
11,036,038Closed-loop control of a scanner with frequency-space analysis of a system deviation202110,726,529Method for the determination and compensation of geometric imaging errors202010,330,924Method for generating a control function and method for operating a scanning unit20198,935,127'Method for recording pulse signals'20156,591,223'Process for the recording of pulse signals'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003Patents assigned to ZEISS STIFTUNG (1)· patent assignee history
2003–2021Based in Jena, DE· patent location history
2015–2021Patents assigned to ZEISS CARL MICROSCOPY GMBH (4)· patent assignee history
2015Patents assigned to KLEMM FRANK (1)· patent assignee history
2015Patents assigned to LIEDTKE MIRKO (1)· patent assignee history
2015Patents assigned to LOTH MANFRED (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL MICROSCOPY GMBH | 4 | 2015–2021 |
| KLEMM FRANKself | 1 | 2015 |
| LIEDTKE MIRKO | 1 | 2015 |
| LOTH MANFRED | 1 | 2015 |
| ZEISS STIFTUNG | 1 | 2003 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jena, DE | 5 | 2003–2021 |