Inventor
Hiroyuki Sadakata
Inventor
Osaka, JP
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores73%
G01RMeasuring electric variables7%
G06FElectric digital data processing7%
H03KPulse technique7%
H10BElectronic memory devices7%
PatentTitleYear
8,446,792'Semiconductor integrated circuit'20138,078,949'Semiconductor memory device'20117,529,144'Hierarchical semiconductor memory device capable of carrying out a disturb refresh test on a memory array basis'20097,471,579'Semiconductor memory and test method for the same'20087,460,426'Semiconductor memory device'20087,174,489'Semiconductor memory test device'20076,909,624'Semiconductor memory device and test method thereof'20056,788,565'Semiconductor memory device'20046,765,814'Semiconductor memory device'20046,711,050'Semiconductor memory'20046,501,701'Semiconductor memory device'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2008Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (7)· patent assignee history
2002–2013Based in Osaka, JP· patent location history
2004–2007Based in Takatsuki, JP· patent location history
2008–2013Patents assigned to PANASONIC CORP (4)· patent assignee history
2011–2013Patents assigned to SADAKATA HIROYUKI (2)· patent assignee history
2011Patents assigned to IIDA MASAHISA (1)· patent assignee history
2013Patents assigned to FUKUSHIMA YOSHIFUMI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MATSUSHITA ELECTRIC INDUSTRIAL CO LTD | 7 | 2002–2008 |
| PANASONIC CORP | 4 | 2008–2013 |
| SADAKATA HIROYUKIself | 2 | 2011–2013 |
| FUKUSHIMA YOSHIFUMI | 1 | 2013 |
| IIDA MASAHISA | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Osaka, JP | 9 | 2002–2013 |
| Takatsuki, JP | 2 | 2004–2007 |