Inventor
Peter W. Stephens
Inventor
Stony Brook, NY, US
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G01VGeophysics50%
PatentTitleYear
5,007,072'X-ray diffraction inspection system'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991Patents assigned to ION TRACK INSTR (1)· patent assignee history
1991Based in Stony Brook, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ION TRACK INSTR | 1 | 1991 |
Locations
| Location | Patents | Span |
|---|---|---|
| Stony Brook, New York, US | 1 | 1991 |