Inventor
Tetsumasa Ito
Inventor
Chiba, JP
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
Y10TTechnical subjects covered by former us classification18%
H01JElectric discharge tubes or discharge lamps16%
B01LChemical or physical laboratory apparatus for general use5%
H01LSemiconductor devices5%
H02NElectric machines not otherwise provided for5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry3%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling3%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors3%
PatentTitleYear
D0927422Servomotor202110,957,573Electrostatic chuck device including a heating member202110,923,381Electrostatic chuck device20219,527,681'Thin-section sample fabrication apparatus and method of fabricating thin-section sample'20169,164,014'Thin section fabrication apparatus and method of fabricating thin section'20158,166,855'Thin section preparing apparatus and thin section preparing method'20128,156,853'Automatic thin-section manufacturing system'20128,110,146'Embedded block humidifier, automatic thin slice manufacturing device, and automatic thin slice specimen manufacturing apparatus'20128,087,334'Sectioning instrument'20128,074,547'Automatic slicing apparatus'20117,966,091'Automatic thin-section slides manufacturing system and method'20117,866,464'Thin-section conveyor apparatus, thin-section scooping tool, and method for transporting thin sections'20117,802,507'Automatic sliced piece fabricating apparatus and automatic sliced piece sample fabricating apparatus'20107,616,302'Container for processing section samples, processing method for section samples, and processing apparatus for section samples'20096,893,824'Gene detection system, gene detection device comprising same, detection method, and gene detecting chip'20056,002,129'Inductively coupled plasma mass spectrometric and spectrochemical analyzer'19995,773,823'Plasma ion source mass spectrometer'19985,559,337'Plasma ion source mass analyzing apparatus'19965,477,048'Inductively coupled plasma mass spectrometer'19955,334,834'Inductively coupled plasma mass spectrometry device'19944,740,696'ICP mass spectrometer'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988–2021Based in Tokyo, JP· patent location history
1994–2012Patents assigned to SEIKO INSTR INC (14)· patent assignee history
1996–2012Based in Chiba, JP· patent location history
2005Based in Matsudo, JP· patent location history
2011–2012Patents assigned to FUJIMOTO KOJI (5)· patent assignee history
2011–2012Patents assigned to ITO TETSUMASA (5)· patent assignee history
2011–2012Patents assigned to MIYATANI TATSUYA (3)· patent assignee history
2012Patents assigned to FUJIWARA HIROHITO (2)· patent assignee history
2015–2016Based in Kawasaki, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SEIKO INSTR INC | 14 | 1994–2012 |
| FUJIMOTO KOJI | 5 | 2011–2012 |
| ITO TETSUMASAself | 5 | 2011–2012 |
| MIYATANI TATSUYA | 3 | 2011–2012 |
| FUJIWARA HIROHITO | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Chiba, JP | 12 | 1996–2012 |
| Tokyo, JP | 6 | 1988–2021 |
| Kawasaki, JP | 2 | 2015–2016 |
| Matsudo, JP | 1 | 2005 |