Inventor
Naoaki Wakayama
Inventor
Ibaraki, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation25%
H01JElectric discharge tubes or discharge lamps25%
G01FMeasuring volume, volume flow, mass flow or liquid level13%
G06GAnalogue computers13%
G21CNuclear reactors13%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution13%
PatentTitleYear
4,682,036'Gamma ray compensation-type neutron ionization chamber'19874,527,084'Radiation counter'19854,423,629'Method and apparatus for sensing liquid level'19844,302,696'Gamma-ray compensated ionization chamber'19814,228,355'Method for shortening response time of logarithmic measuring apparatus'1980Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1980–1987Patents assigned to JAPAN ATOMIC ENERGY RES INST (3)· patent assignee history
1980–1987Based in Ibaraki, JP· patent location history
1981–1987Patents assigned to MITSUBISHI ELECTRIC CORP (2)· patent assignee history
1981Based in Tokai, JP· patent location history
1984Patents assigned to SUKEKAWA ELECTRIC CO LTD (1)· patent assignee history
1985Patents assigned to WAKAYAMA NAOAKI (1)· patent assignee history
1985Based in Oaza, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JAPAN ATOMIC ENERGY RES INST | 3 | 1980–1987 |
| MITSUBISHI ELECTRIC CORP | 2 | 1981–1987 |
| SUKEKAWA ELECTRIC CO LTD | 1 | 1984 |
| WAKAYAMA NAOAKIself | 1 | 1985 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ibaraki, JP | 3 | 1980–1987 |
| Oaza, JP | 1 | 1985 |
| Tokai, JP | 1 | 1981 |