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Inventor

Toshiyuki Kiyokawa

Inventor
Tokyo, JP

Overview

19→
Patents
1992–2017
Patent span
Physics
Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables47%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1029%
H05KPrinted circuits11%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling3%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors3%
H01LSemiconductor devices3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
LOC133%
PatentTitleYear
9,588,142'Electronic device handling apparatus and electronic device testing apparatus'20179,121,901'Semiconductor wafer test apparatus'20158,513,962'Wafer tray and test apparatus'20138,493,083'Test apparatus, test method and computer readable medium'20138,299,935'Test apparatus and test method'20127,298,156'Electronic part test apparatus'20076,590,383'Contact arm and electronic device testing apparatus using the same'20036,456,062'Contact arm and electronic device testing apparatus using the same'20026,445,203'Electric device testing apparatus'20026,313,653'IC chip tester with heating element for preventing condensation'2001D0442568'IC module insert'20016,218,849'Device for detecting proper mounting of an IC for testing in an IC testing apparatus'20016,019,564'Semiconductor device transporting and handling apparatus'20005,920,192'Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function'19995,812,409'Semiconductor device transport system with deformed tray compensation'19985,742,168'Test section for use in an IC handler'19985,722,514'Tray installation rack for test handler'19985,177,435'IC test equipment'19935,172,049'IC test equipment'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2017Patents assigned to ADVANTEST CORP (19)· patent assignee history
1992–1993Based in Kitakatsushika-gun, JP· patent location history
1998–2001Based in Kuki, JP· patent location history
2001–2017Based in Tokyo, JP· patent location history
2012–2015Patents assigned to KIYOKAWA TOSHIYUKI (4)· patent assignee history
2012Patents assigned to OKAWA TOSHIKAZU (1)· patent assignee history
2012–2015Based in Saitama, JP· patent location history
2013Patents assigned to UMEMURA YOSHIHARU (1)· patent assignee history
2015Patents assigned to NAITO TAKASHI (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ADVANTEST CORP191992–2017
KIYOKAWA TOSHIYUKIself42012–2015
NAITO TAKASHI12015
OKAWA TOSHIKAZU12012
UMEMURA YOSHIHARU12013
Locations
LocationPatentsSpan
Tokyo, JP72001–2017
Kuki, JP61998–2001
Saitama, JP42012–2015
Kitakatsushika-gun, JP21992–1993