Inventor

Taiko Motoi

Inventor
Atsugi, JP

Overview

34→
Patents
1987–2012
Patent span
Physics
Primary field (CPC G)

Patents· 34 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps23%
B82YSpecific uses or applications of nanostructures10%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein10%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G02BOptical elements, systems or apparatus6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests6%
B03BSeparating solid materials using liquids or using pneumatic tables or jigs4%
B09BDisposal of solid waste not otherwise provided for4%
C25DProcesses for the electrolytic or electrophoretic production of coatings4%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
PatentTitleYear
8,337,712'Method for forming etching mask, method for fabricating three-dimensional structure and method for fabricating three-dimensional photonic crystalline laser device'20128,134,288'Electron-emitting device, electron source, and image display apparatus'20128,084,365'Method of manufacturing a nano structure by etching, using a substrate containing silicon'20117,902,637'Nano structure and method of manufacturing nano structure'20117,700,390'Method for fabricating three-dimensional photonic crystal'20107,615,764'Information acquisition apparatus, cross section evaluating apparatus, cross section evaluating method, and cross section working apparatus'20097,531,797'Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method'20097,416,462'Glass substrate processing method and material removal process using x-ray fluorescence'20087,385,206'Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method'20087,297,947'Apparatus and method for evaluating cross section of specimen'20077,291,962'Electron-emitting device, electron source using the electron-emitting devices, and image-forming apparatus using the electron source'20077,053,370'Information acquisition apparatus, cross section evaluating apparatus, cross section evaluating method, and cross section working apparatus'20066,958,842'Display device and process for production thereof'20056,951,494'Spacer recovery method and apparatus used during disassembling of an image display apparatus'20056,917,146'Electron-emitting device having carbon films with a particular orientation, electron source using electron-emitting device, and image forming apparatus'20056,888,296'Electron-emitting device, electron source using the electron-emitting devices, and image-forming apparatus using the electron source'20056,882,463'Particles for electrophoretic display and electrophoretic display apparatus using them'20056,876,476'Display device and process for production thereof'20056,851,998'Electron-emitting device, electron source using electron-emitting device, and image forming apparatus'20056,803,704'Channel plate and manufacturing method thereof'20046,632,113'Image display apparatus, disassembly processing method therefor, and component recovery method'20036,541,386'Method for producing a structure with narrow pores'20036,380,665'Electron-emitting device, electron source using the electron-emitting devices, and image-forming apparatus using the electron source'20026,214,738'Method for producing narrow pores and structure having the narrow pores, and narrow pores and structure produced by the method'20016,017,259'Method of manufacturing electron-emitting device, electron source and image-forming apparatus'20005,481,491'Recording medium, recording method, and readout method'19965,289,402'Recording medium, recording method, and readout method'19945,182,253'Purification apparatus for superconductor fine particles'19935,155,093'Light detecting device and light detecting method using a superconnector'19924,802,743'Liquid crystal device having color filters wherein the color filters formed from a polyamino resin containing coloring materials'19894,793,692'Color filter'19884,777,117'Process for producing color filter using alignment marks'19884,744,637'Liquid crystal device with a protective layer of a particular coefficient of expansion'19884,712,874'Ferroelectric liquid crystal device having color filters on row or column electrodes'1987

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1987–2012Patents assigned to CANON KK (34)· patent assignee history
1987–1996Based in Sagamihara, JP· patent location history
1992–2012Based in Atsugi, JP· patent location history
2004–2009Based in Kanagawa, JP· patent location history
2011–2012Patents assigned to MOTOI TAIKO (3)· patent assignee history
2011–2012Patents assigned to AIBA TOSHIAKI (2)· patent assignee history
2011–2012Patents assigned to OKUNUKI MASAHIKO (2)· patent assignee history
2011–2012Patents assigned to ONO HARUHITO (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CANON KK341987–2012
MOTOI TAIKOself32011–2012
AIBA TOSHIAKI22011–2012
OKUNUKI MASAHIKO22011–2012
ONO HARUHITO22011–2012
Locations
LocationPatentsSpan
Atsugi, JP191992–2012
Sagamihara, JP81987–1996
Kanagawa, JP72004–2009