Inventor
Markus Seuring
Inventor
Dresden, DE
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables44%
G11CStatic stores33%
G06FElectric digital data processing22%
PatentTitleYear
9,885,752'Test apparatus for generating reference scan chain test data and test system'20189,164,726'Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence'20158,307,249'At-speed bitmapping in a memory built-in self-test by locking an N-TH failure'20127,689,884'Multicore chip test'20107,673,208'Storing multicore chip test data'20107,653,845'Test algorithm selection in memory built-in self test controller'20107,340,658'Technique for combining scan test and memory built-in self test'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2010Patents assigned to ADVANCED MICRO DEVICES INC (4)· patent assignee history
2008–2010Based in Dresden, DE· patent location history
2012–2018Patents assigned to SEURING MARKUS (3)· patent assignee history
2012Patents assigned to EICHHORN KAI (1)· patent assignee history
2012–2018Based in Stuttgart, DE· patent location history
2015–2018Patents assigned to ADVANTEST CORP (2)· patent assignee history
2018Patents assigned to BRAUN MICHAEL (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANCED MICRO DEVICES INC | 4 | 2008–2010 |
| SEURING MARKUSself | 3 | 2012–2018 |
| ADVANTEST CORP | 2 | 2015–2018 |
| BRAUN MICHAEL | 1 | 2018 |
| EICHHORN KAI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Dresden, DE | 4 | 2008–2010 |
| Stuttgart, DE | 3 | 2012–2018 |