Inventor

Robert Kamil Bryll

Inventor

Bothell, WA, US

Overview

2001–2020

Patent span

Physics

Primary field (CPC G)

Patents· 34 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary

H04NPictorial communication, e.g. television18%

G02BOptical elements, systems or apparatus16%

G06TImage data processing or generation, in general16%

G01BMeasuring length, thickness or similar linear dimensions10%

G06VImage or video recognition or understanding8%

G01NInvestigating or analysing materials by determining their chemical or physical properties7%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein7%

G03BApparatus or arrangements for taking photographs or for projecting or viewing them7%

G06FElectric digital data processing7%

G06KGraphical data reading3%

PatentTitleYear

10,880,468Metrology system with transparent workpiece surface mode2020 10,341,646Variable focal length lens system with optical power monitoring2019 10,281,700Variable focal length lens system including a focus state reference subsystem2019 10,178,321Machine vision inspection system and method for obtaining an image with an extended depth of field2019 10,171,725Variable focal length lens system including a focus state reference subsystem2019 10,101,572Variable focal length lens system with multi-level extended depth of field image processing2018 9,961,253Autofocus system for a high speed periodically modulated variable focal length lens2018 9,930,243'Variable focal length imaging system'2018 9,830,694Multi-level image focus using a tunable lens in a machine vision inspection system2017 9,774,765'Chromatic aberration correction in imaging system including variable focal length lens'2017 9,740,190'Method for programming a three-dimensional workpiece scan path for a metrology system'2017 9,736,355'Phase difference calibration in a variable focal length lens system'2017 9,726,876'Machine vision inspection system and method for obtaining an image with an extended depth of field'2017 9,177,222'Edge measurement video tool and interface including automatic parameter set alternatives'2015 9,060,117'Points from focus operations using multiple light settings in a machine vision system'2015 8,995,749'Enhanced edge detection tool for edges of irregular surfaces'2015 8,917,940'Edge measurement video tool with robust edge discrimination margin'2014 8,885,945'Method for improving repeatability in edge location results of a machine vision inspection system'2014 8,773,526'Edge detection using structured illumination'2014 8,534,113'Optical aberration correction for machine vision inspection systems'2013 8,311,311'Optical aberration correction for machine vision inspection systems'2012 8,111,938'System and method for fast approximate focus'2012 8,055,466'Global calibration for stereo vision probe'2011 7,885,480'Correlation peak finding method for image correlation displacement sensing'2011 7,724,942'Optical aberration correction for machine vision inspection systems'2010 7,668,388'System and method for single image focus assessment'2010 7,636,478'Fast multiple template matching using a shared correlation map'2009 7,580,560'System and method for fast template matching by adaptive template decomposition'2009 7,454,053'System and method for automatically recovering video tools in a vision system'2008 7,394,926'Magnified machine vision user interface'2008 7,313,762'Methods and systems for real-time storyboarding with a web page and graphical user interface for automatic video parsing and browsing'2007 6,647,535'Methods and systems for real-time storyboarding with a web page and graphical user interface for automatic video parsing and browsing'2003 6,493,042'Feature based hierarchical video segmentation'2002 6,252,975'Method and system for real time feature based motion analysis for key frame selection from a video'2001

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2001–2007Patents assigned to XEROX CORP (4)· patent assignee history

2001–2007Based in Chicago, IL, US· patent location history

2008–2020Patents assigned to MITUTOYO CORP (30)· patent assignee history

2008–2020Based in Bothell, WA, US· patent location history

2012–2014Patents assigned to BRYLL ROBERT K (3)· patent assignee history

2012Patents assigned to DELANEY MARK L (1)· patent assignee history

2012Patents assigned to NAHUM MICHAEL (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MITUTOYO CORP	30	2008–2020
XEROX CORP	4	2001–2007
BRYLL ROBERT Kself	3	2012–2014
DELANEY MARK L	1	2012
NAHUM MICHAEL	1	2012

Locations

Location	Patents	Span
Bothell, Washington, US	30	2008–2020
Chicago, Illinois, US	4	2001–2007