Inventor
Daniel E. Sutton
Inventor
Austin, TX, US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1044%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices33%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H10DInorganic electric semiconductor devices11%
PatentTitleYear
6,759,179'Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process'20046,649,525'Methods and systems for controlling resist residue defects at gate layer in a semiconductor device manufacturing process'20036,524,869'Method and apparatus for detecting ion implant induced defects'20036,440,621'Method of detecting film defects using chemical exposure of photoresist films'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2004Patents assigned to ADVANCED MICRO DEVICES INC (4)· patent assignee history
2002–2004Based in Austin, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADVANCED MICRO DEVICES INC | 4 | 2002–2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Austin, Texas, US | 4 | 2002–2004 |