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Inventor

Krzysztof Dabrowiecki

Inventor
Fremont, CA, US

Overview

4→
Patents
1999–2014
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables80%
Y10TTechnical subjects covered by former us classification20%
PatentTitleYear
8,664,969'Methods and apparatus for implementing electrical connectivity for electronic circuit testing'20147,064,564'Bundled probe apparatus for multiple terminal contacting'20066,204,674'Assembly structure for making integrated circuit chip probe cards'20015,884,395'Assembly structure for making integrated circuit chip probe cards'1999

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1999Patents assigned to PROBE TECHNOLOGY (1)· patent assignee history
1999–2001Based in San Leandro, CA, US· patent location history
2001Patents assigned to PROBE TECHNOLOGY INC (1)· patent assignee history
2006Patents assigned to ANTARES CONTECH INC (1)· patent assignee history
2006–2014Based in Fremont, CA, US· patent location history
2014Patents assigned to CLEGG SCOTT (1)· patent assignee history
2014Patents assigned to DABROWIECKI KRZYSZTOF (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ANTARES CONTECH INC12006
CLEGG SCOTT12014
DABROWIECKI KRZYSZTOFself12014
PROBE TECHNOLOGY11999
PROBE TECHNOLOGY INC12001
Locations
LocationPatentsSpan
Fremont, California, US22006–2014
San Leandro, California, US21999–2001