Inventor

Hoon Choi

Inventor

Seoul, KR

Overview

19→

Patents

1991–2010

Patent span

Physics

Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary

G11CStatic stores52%

G06FElectric digital data processing11%

H10BElectronic memory devices11%

H04NPictorial communication, e.g. television7%

Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use7%

G05FSystems for regulating electric or magnetic variables4%

G09GArrangements or circuits for control of indicating devices using static means to present variable information4%

H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems4%

PatentTitleYear

7,778,267'Bus system'2010 6,560,679'Method and apparatus for reducing power consumption by skipping second accesses to previously accessed cache lines'2003 6,345,003'Redundancy circuits for integrated circuit memory devices including repair controlling circuits and enable controlling circuits'2002 6,317,351'Associative cache memory capable of reconfiguring a K-way and N-set cache memory into a M-unit, K-way and N/M-set cache memory'2001 5,940,343'Memory sub-word line driver operated by unboosted voltage'1999 5,933,382'Semiconductor memory device including a redundant memory cell circuit which can reduce a peak current generated in a redundant fuse box'1999 5,901,055'Internal boosted voltage generator of semiconductor memory device'1999 5,610,549'Voltage boosting circuit of a semiconductor memory circuit'1997 5,521,871'Voltage boosting circuit of a semiconductor memory circuit'1996 5,418,746'Write signal input buffer for a semiconductor memory device'1995 5,374,839'Semiconductor memory device'1994 5,299,161'Method and device for improving performance of a parallel write test of a semiconductor memory device'1994 5,197,031'Method for writing data in testing memory device and circuit for testing memory device'1993 5,161,012'Multi-screen generation circuit'1992 5,140,553'Flash writing circuit for writing test data in dynamic random access memory (DRAM) devices'1992 5,107,254'Address producing circuit for zoom function'1992 5,046,049'Method of flash write for testing a RAM'1991 5,034,625'Semiconductor substrate bias circuit'1991 5,016,106'Image signal processing circuit for producing multiple pictures on a common display screen'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–2010Patents assigned to SAMSUNG ELECTRONICS CO LTD (19)· patent assignee history

1991–2010Based in Seoul, KR· patent location history

1991–1993Based in Taegu, KR· patent location history

1994Based in Suwon-si, KR· patent location history

1995–1997Based in Kyungki-do, KR· patent location history

1999Based in Guri, KR· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
SAMSUNG ELECTRONICS CO LTD	19	1991–2010

Locations

Location	Patents	Span
Seoul, KR	9	1991–2010
Taegu, KR	4	1991–1993
Kyungki-do, KR	3	1995–1997
Guri, KR	1	1999
Suwon-si, KR	1	1994