Inventor

Toshinori Hosokawa

Inventor

Osaka, JP

Overview

1994–2021

Patent span

Physics

Primary field (CPC G)

Patents· 16 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables83%

G02BOptical elements, systems or apparatus6%

G03BApparatus or arrangements for taking photographs or for projecting or viewing them6%

H04NPictorial communication, e.g. television6%

PatentTitleYear

10,999,490Imaging control device and imaging control method2021 7,437,340'Designing of a logic circuit for testability'2008 6,708,315'Method of design for testability, method of design for integrated circuits and integrated circuits'2004 6,651,206'Method of design for testability, test sequence generation method and semiconductor integrated circuit'2003 6,510,535'Method of design for testability for integrated circuits'2003 6,449,743'Method of generating test sequences'2002 6,292,915'Method of design for testability and method of test sequence generation'2001 6,271,677'Semiconductor integrated circuit and method for testing the semiconductor integrated circuit'2001 6,253,343'Method of design for testability test sequence generation method and semiconductor integrated circuit'2001 6,185,721'Method of design for testability at RTL and integrated circuit designed by the same'2001 6,016,564'Method of design for testability, method of design for avoiding bus error and integrated circuit'2000 5,748,646'Design-for-testability method for path delay faults and test pattern generation method for path delay faults'1998 5,737,341'Method of generating test sequence and apparatus for generating test sequence'1998 5,483,543'Test sequence generation method'1996 5,319,647'Method and apparatus for performing automatic test pattern generation'1994 5,305,328'Method of test sequence generation'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2004Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (14)· patent assignee history

1994–2003Based in Osaka, JP· patent location history

1994–1996Based in Daito, JP· patent location history

2004–2021Based in Tokyo, JP· patent location history

2008Patents assigned to SEMICONDUCTOR TECH ACAD RES CT (1)· patent assignee history

2021Patents assigned to SONY CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD	14	1994–2004
SEMICONDUCTOR TECH ACAD RES CT	1	2008
SONY CORP	1	2021

Locations

Location	Patents	Span
Osaka, JP	11	1994–2003
Tokyo, JP	3	2004–2021
Daito, JP	2	1994–1996