Inventor
Hiroshi Kakibayashi
Inventor
Nagareyama, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps41%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
G01RMeasuring electric variables11%
B82YSpecific uses or applications of nanostructures5%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%
H10HInorganic light-emitting semiconductor devices having potential barriers5%
B01LChemical or physical laboratory apparatus for general use3%
C30BSingle-crystal growth3%
G02BOptical elements, systems or apparatus3%
G06TImage data processing or generation, in general3%
PatentTitleYear
7,145,146'Micro-spectroscopic measuring device and micro-chemical system'20067,034,299'Transmission electron microscope system and method of inspecting a specimen using the same'20066,875,984'Bio electron microscope and observation method of specimen'20056,822,233'Method and apparatus for scanning transmission electron microscopy'20046,548,811'Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope'20036,531,697'Method and apparatus for scanning transmission electron microscopy'20036,051,834'Electron microscope'20005,932,880'Scintillator device and image pickup apparatus using the same'19995,866,905'Electron microscope'19995,744,800'Defect observing electron microscope'19985,717,207'Transmission electron microscope with camera system'19985,650,621'Electron microscope'19975,552,602'Electron microscope'19965,475,218'Instrument and method for 3-dimensional atomic arrangement observation'19955,453,617'Electron microscope for specimen composition and strain analysis and observation method thereof'19955,362,972'Semiconductor device using whiskers'19945,332,910'Semiconductor optical device with nanowhiskers'19945,278,408'Instrument and method for 3-dimensional atomic arrangement observation'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2006Patents assigned to HITACHI LTD (17)· patent assignee history
1994Patents assigned to HITACHI VLSI ENG (1)· patent assignee history
1994–2006Based in Nagareyama, JP· patent location history
2005–2006Patents assigned to HITACHI HIGH TECH CORP (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 17 | 1994–2006 |
| HITACHI HIGH TECH CORP | 2 | 2005–2006 |
| HITACHI VLSI ENG | 1 | 1994 |
Locations
| Location | Patents | Span |
|---|---|---|
| Nagareyama, JP | 18 | 1994–2006 |